无机材料学报 ›› 2026, Vol. 41 ›› Issue (8): 1036-1048.DOI: 10.15541/jim20250397
收稿日期:2025-10-11
修回日期:2025-11-13
出版日期:2026-08-20
网络出版日期:2025-12-11
通讯作者:
单青松, 副研究员. E-mail: shanqingsong@njust.edu.cn;作者简介:钟 鸿(2001-), 男, 硕士研究生. E-mail: zhonghong@njust.edu.cn
基金资助:
ZHONG Hong(
), ZHANG Yuhao, SHAN Qingsong(
), HU Tianjun, ZENG Haibo(
)
Received:2025-10-11
Revised:2025-11-13
Published:2026-08-20
Online:2025-12-11
Contact:
SHAN Qingsong, associate professor. E-mail: shanqingsong@njust.edu.cn;About author:ZHONG Hong (2001-), male, Master candidate. E-mail: zhonghong@njust.edu.cn
Supported by:摘要:
叠层量子点发光二极管(Tandem Quantum-dot Light-emitting Diode, TQLED)作为量子点发光二极管(Quantum-dot Light-emitting Diode, QLED)技术的重要延伸, 通过引入多发光单元与电荷产生层结构, 实现了外量子效率、亮度及寿命的显著提升, 成为新一代高性能显示器件的研究热点。尽管TQLED的研究已经取得了巨大进展, 其仍面临着电荷注入不平衡、溶液工艺兼容性差、材料环保性及器件长期工作下稳定性不足等问题。本文首先介绍了TQLED的基本结构与工作原理, 对比了其相对于普通单层QLED存在的优势, 并详细介绍了电荷产生层的工作原理及其在多发光单元协同工作中发挥的关键作用。随后, 围绕倒置、正置、多发光材料以及其他创新叠层器件结构, 系统分析了不同材料体系、加工工艺以及结构设计在提升器件性能方面的研究进展, 总结了TQLED在效率、亮度及稳定性等方面实现的突破。最后, 指出了当前TQLED面临的挑战, 并从材料创新、结构优化和工艺革新等方面提出了未来可能的发展路径与研究重点, 特别强调了开发环境友好型量子点材料、创新溶液加工工艺以及构建稳定的界面结构的重要性。本文旨在为TQLED的后续技术开发提供理论指导和技术参考, 推动其从实验室研究向产业化应用加速迈进。
中图分类号:
钟鸿, 张宇豪, 单青松, 胡天鋆, 曾海波. 叠层量子点发光二极管的研究进展[J]. 无机材料学报, 2026, 41(8): 1036-1048.
ZHONG Hong, ZHANG Yuhao, SHAN Qingsong, HU Tianjun, ZENG Haibo. Research Progress on Tandem Quantum-dot Light-emitting Diodes[J]. Journal of Inorganic Materials, 2026, 41(8): 1036-1048.
图1 普通单层QLED与双层TQLED工作原理及参数对比
Fig. 1 Comparison of working principles and parameters between conventional single-layer QLED and two-layer TQLED (a) Single emissive layer device; (b) Tandem device with two emissive layers; (c) Comparison of core parameters between two types of light-emitting devices. HTL: hole transport layer; ETL: electron transport layer
| Processing method | Material | Type |
|---|---|---|
| Vacuum deposition | FeCl3:NPB | P type |
| Li:Alq | N type | |
| HATCN, MoO3 | Electron acceptor | |
| IZO, Ag, Al | Ultra thin conductive layer | |
| Solution method | PEDOT:PSS | P type |
| ZnO, ZnMgO | N type |
表1 电荷产生层常用材料
Table 1 Common materials for charge generation layer
| Processing method | Material | Type |
|---|---|---|
| Vacuum deposition | FeCl3:NPB | P type |
| Li:Alq | N type | |
| HATCN, MoO3 | Electron acceptor | |
| IZO, Ag, Al | Ultra thin conductive layer | |
| Solution method | PEDOT:PSS | P type |
| ZnO, ZnMgO | N type |
图3 倒置叠层器件结构及优化效果[54,58 -59,66,68]
Fig. 3 Structure and optimization effects of inverted tandem devices[54,58 -59,66,68] (a) Schematic diagram of energy level arrangement of inverted TQLED device[58]; (b) Wetting angle change before and after IPA addition[66]; (c) Photoluminescence (PL) decay curves of red quantum dots on different functional layer thin films[68]; (d) Energy level structure and electric field induced charge generation of semiconductor-metal-dielectric material CGL[54]; (e) Charge generation efficiency of CGL with and without microstructure[59]; (f) Electroluminescence photos of green and red tandem anti-counterfeiting devices under 8 V (left) and 13 V (right) driving voltages[59]
图4 正置叠层器件结构及优化效果[43,48,52,72]
Fig. 4 Structure and optimization effects of conventional tandem devices[43,48,52,72] (a) Conventional TQLED energy level structure[48]; (b) PL spectra of green quantum dots covered with ZnMgO/Al/HATCN/MoO3 before and after chlorobenzene rinsing[48]; (c) White TQLED working diagram[52]; (d) Color gamut diagram[72]; (e) Comparison of lifetime between tandem and single-layer devices[43]
图5 多发光材料叠层器件结构及优化效果[57,75 -76]
Fig. 5 Structure and optimization effects of multi luminescent materials tandem devices[57,75 -76] (a) Device structure, (b) electroluminescence (EL) spectra and (c) color gamut of cadmium-based/organic tandem device[57]; (d) Device structure, (e) simulated electric field before and after inserting MoO3 and (f) working lifetime and surface temperature comparison of perovskite/organic tandem device[75]; (g) Tandem device structure with optical microcavity and (h) EL spectra of organic, perovskite, and tandem devices[76]
图6 其他创新叠层器件结构及效果[78,80 -81]
Fig. 6 Structure and optimization effects of other innovative tandem devices[78,80 -81] (a) Device structure and (b) AC signal controlled output color of the AC-driven TQLED[78]; (c) Device structure and (d) full-color pixel working diagram of the light output control device[80]; (e) Flexible TQLED assembly processes and working diagram[81]
| Color | CGL | Effect | EQE/% | Lifetime/h | Ref. |
|---|---|---|---|---|---|
| Red | TCTA/MoO3/IZO/ZnMgO | 1. Energy level matching 2. Potential barrier reduction | 49.01 | >50000 (T95*@1000 cd/m2) | [ |
| Green | PMA/Al:AlOx | 1. Achieved charge injection balance 2. Suppressed current leakage 3. Prevention of solvent damage to the lower layer | 50.3 | 19000 (T50@100 mA/cm2) | [ |
| Blue | 24 | - | |||
| White | PEDOT:PSS/ZnO/PEIE | 1. Improved charge injection balance 2. Inhibition of quenching | 28 | - | [ |
| Red | ZnMgO/PEDOT:PSS | 1. Improved CGL acid resistance 2. Inhibition of quenching | 35 | 12000 (T50@1000 cd/m2) | [ |
| Red | ZnMgO/Al/HATCN/MoO3 | - | 34.4 | - | [ |
| Green | ZnMgO/Al/HATCN/MoO3 | 1. Reduced solvent damage 2. Implementing a matching energy level arrangement 3. Improved balance of carrier injection | 27.6 | 53808 (T50@100 cd/m2) | [ |
| Blue | 21.4 | 107 (T50@100 cd/m2) | |||
| White | ZnO/PMA | 1. Reduced solvent damage 2. Improved charge injection and transfer capability 3. High transmittance to reduce parasitic light absorption | 27.3 | - | [ |
| Green | Bphen:Cs2CO3/Al/HATCN/ MoO3/CBP | - | 40 | 42080 (T50@100 cd/m2) | [ |
| White | Bphen:Yb/HATCN/TAPC | - | 23.9 | - | [ |
| Red | - | 1. Prevention of solvent damage to the lower layer 2. High-efficiency interconnection | 60.7 | ≈30000 (T95@1000 cd/m2) | [ |
| Red | ITO | 1. Improved balance of carrier injection 2. Optimized optical external coupling | 51.2 | ≈31383 (T95@1000 cd/m2) | [ |
| Red | ZnMgO/PMA/AMA | 1. Improved balance of carrier injection 2. Improved CGL acid resistance 3. Improved morphology of thin films | - | - | [ |
表2 近年来TQLED器件结构及性能
Table 2 Structure and performance of TQLED devices in recent years
| Color | CGL | Effect | EQE/% | Lifetime/h | Ref. |
|---|---|---|---|---|---|
| Red | TCTA/MoO3/IZO/ZnMgO | 1. Energy level matching 2. Potential barrier reduction | 49.01 | >50000 (T95*@1000 cd/m2) | [ |
| Green | PMA/Al:AlOx | 1. Achieved charge injection balance 2. Suppressed current leakage 3. Prevention of solvent damage to the lower layer | 50.3 | 19000 (T50@100 mA/cm2) | [ |
| Blue | 24 | - | |||
| White | PEDOT:PSS/ZnO/PEIE | 1. Improved charge injection balance 2. Inhibition of quenching | 28 | - | [ |
| Red | ZnMgO/PEDOT:PSS | 1. Improved CGL acid resistance 2. Inhibition of quenching | 35 | 12000 (T50@1000 cd/m2) | [ |
| Red | ZnMgO/Al/HATCN/MoO3 | - | 34.4 | - | [ |
| Green | ZnMgO/Al/HATCN/MoO3 | 1. Reduced solvent damage 2. Implementing a matching energy level arrangement 3. Improved balance of carrier injection | 27.6 | 53808 (T50@100 cd/m2) | [ |
| Blue | 21.4 | 107 (T50@100 cd/m2) | |||
| White | ZnO/PMA | 1. Reduced solvent damage 2. Improved charge injection and transfer capability 3. High transmittance to reduce parasitic light absorption | 27.3 | - | [ |
| Green | Bphen:Cs2CO3/Al/HATCN/ MoO3/CBP | - | 40 | 42080 (T50@100 cd/m2) | [ |
| White | Bphen:Yb/HATCN/TAPC | - | 23.9 | - | [ |
| Red | - | 1. Prevention of solvent damage to the lower layer 2. High-efficiency interconnection | 60.7 | ≈30000 (T95@1000 cd/m2) | [ |
| Red | ITO | 1. Improved balance of carrier injection 2. Optimized optical external coupling | 51.2 | ≈31383 (T95@1000 cd/m2) | [ |
| Red | ZnMgO/PMA/AMA | 1. Improved balance of carrier injection 2. Improved CGL acid resistance 3. Improved morphology of thin films | - | - | [ |
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