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Fig. 7 d₃₃ and k_p of (1-x)(0.8PZT-0.2PZN)-xBZT ceramics
Fig. 6 Temperature dependence of ε_r and tanδ of (1-x)(0.8PZT-0.2PZN)-xBZT ceramics (a) x=0; (b) x=0.02; (c) x=0.04; (d) x=0.06; (e) x=0.08; (f) x=0.10; (g) x=0.12; (h) x=0.14. Colorful figures are available on website
Fig. 5 Room temperature out-of-plane height, amplitude, and phase images of (1-x)(0.8PZT-0.2PZN)-xBZT ceramics (a) x=0; (b) x=0.08; (c) x=0.14. Colorful figures are available on website
Fig. 4 P-E hysteresis loops (a), J-E curves (b) and variation trends of the remnant polarization P_r and coercive field E_c (c) for (1-x)(0.8PZT-0.2PZN)-xBZT ceramics at room temperature Colorful figures are available on website
Fig. 3 Microstructure (a) and element mappings (b-f) of (1-x)(0.8PZT-0.2PZN)-xBZT (x=0.08) ceramics
Fig. 2 SEM images (a-h) and average grain sizes (i) of (1-x)(0.8PZT-0.2PZN)-xBZT ceramics
Fig. 1 XRD patterns of (1-x)(0.8PZT-0.2PZN)-xBZT ceramics
Fig. 7 PFM characterization of CBT-xBi ceramics (a-c) PFM phase images for (a) x=0, (b) x=0.04, and (c) x=0.06; (d-f) PFM amplitude distribution histograms for (d) x=0, (e) x=0.04, and (f) x=0.06; (g) TEM image of CBT-0.06Bi; (h) 5 μm×5 μm PFM phase image of CBT-0.06Bi; (i) Hysteresis loops of CBT-xBi ceramics after polarizing at 180 ℃ and 1 Hz. Colorful figures are available on website
Fig. 6 (a) XRD refinement results of CBT-xBi ceramics; (b) Visual crystal structures of CBT-xBi ceramics; (c) Raman scattering spectra in the range of 80-900 cm^-1; (d) Wavenumber displacements of B_2g, B_3g, A_1g, and B_1g modes
Fig. 5 (a) Dielectric temperature spectra of CBT-xBi ceramics; (b) Temperature dependence of DC resistivity of CBT-xBi ceramics; (c) Effect of heat treatment on the piezoelectric constants of CBT-xBi ceramics (set temperature annealing 2 h); (d) In-situ XRD patterns of CBT-0.06Bi ceramic; (e) Relationship between lattice constants and unit cell volume with temperature; (f) (119) peak position and I₍₂₀₀₎/I₍₀₂₀₎ changed with temperature
Fig. 4 Characterization of CBT-0.06Bi ceramic sintered in a flowing oxygen atmosphere (a) XRD patterns; (b) SEM image of the thermal etching surface; (c) O1s XPS spectrum; (d) Dielectric temperature spectra at 100 Hz before and after polarization
Table 1 Results of CBT-xBi ceramics O1s XPS peak fitting analysis
Fig. 3 XPS core-level spectra of CBT-xBi ceramics (a) O1s; (b) Bi4f; (c) Bi4d_3/2 and Ti2p
Fig. 2 Dielectric properties of CBT-xBi ceramics (a-c) Dielectric constant as a function of temperature at different frequencies after polarization: (a) x=0, (b) x=0.04 and (c) x=0.06; (d-f) Dielectric constant as a function of temperature at 100 Hz before and after polarization: (d) x=0, (e) x=0.04 and (f) x=0.06
Fig. 1 (a-e) Surface SEM images of CBT-xBi ceramics after thermal etching; (f) XRD patterns of CBT-xBi ceramics and corresponding localized enlarged patterns (a) x=0; (b) x=0.02; (c) x=0.04; (d) x=0.06; (e) x=0.08
Table S2 EDS analysis results for the grain (Area 1) and the adjacent second phase (Area 2)
Fig. S4 EDS element mappings of sample S5 sintered at 975 ℃ for 2 h (a) and EDS spectra of the grain phase (Area 1) and the adjacent second phase (Area 2) (b)
Fig. S3 XPS spectra of sample S5 sintered at 1000 ℃ for 2 h (a) and detailed XPS spectra of Cu ion (b), Nb ion (c) and O1s (d)
Fig. S2 Backscattered electron SEM images of the fracture surface of samples S4 and S5
Table S1 Properties of ZnAl₂O₄ ceramics with different formulas of CTN additives

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