Fig.1

A 128-member binary library[15] "

Fig.2

Schematic diagram of combinatorial electrostatic atomization system “M-ist Combi”[16] "

Fig. 3

Schematic illustration for the Czochralski crystal growth[18] "

Fig.4

Schematic illustration for the vertical Bridgman crystal growth[19] "

Fig.5

Variation of Seebeck coefficient values along n-type 0.01/0.055% PbI2 doped (Pb0.95Sn0.05Te)0.92(PbS)0.08 functionally graded materials[24] "

Fig.6

(a) Scheme of a rotor with capsules for sedimentation experiment and (b) mechanism of sedimentation of atoms in the strong acceleration field[25] "

Fig.7

(a) Optical image of the annealed Ti-Ni-Sn thin film materials library; (b-d) color-coded results of the high-throughput EDX measurements of the material library[27] "

Fig.8

EDX measurements of the concentration of (a)magnesium, (b)nickel and (c)aluminum of an Mg-Ni-Al ternary thin film library[30] "

Fig.9

Layout of the nanocalorimeter cell[34] "

Fig.10

Composition trends over the sample library, (a) Si:Cu ratio for the glass-forming component, (b) glass transition temperature and (c) the total enthalpy of this glass reaction[35] "

Fig.11

(a) Schematic of the pump and probe laser measurement setup and (b)temperature increase as a function of time after a single-pulse[33] "

Fig.12

Time-domain thermoreflectance experimental setup[33] "

Fig.13

(a)Thermal conductivity imaging of a Cr-Ti diffusion couple and (b) numerical values for thermal conductivity across the path shown as a dashed line in (a)[40] "

Fig.14

Schematic illustration of SThM setup[43] "

Fig. 15

Quantitative mapping of thermal conductivities, (a) changes in the probe resistance induced by samples with different thermal conductivities; Mappings of (b) resistance change and (c) corresponding thermal conductivities in Yb0.7Co4Sb12; (d) Line scan of resistance change across an interface between different phases[45] "

Fig.16

(a) SEM image, (b) AFM topography image, and (c) thermal map image obtained with the SThM technique are shown simultaneously for the same area of the Ag2Se thin film[46] "

Fig.17

A photograph of the high temperature thermoelectric power factor screening tool and the Seebeck coefficient probe[14] "

Fig.18

Schematics of PSM setup[48] "

Fig.19

Thermopower mappings with different thicknesses grown on Si/Au(a)and quartz/Au(b) substrates[49] "

Fig.20

Seebeck coefficient distribution of the Bi2Te2Se sample with composition gradient[50] "

Fig.21

Schematic diagram of the AFM conductive, heated probe technique for nanoscale Seebeck coefficient characterization[52] "

Fig.22

(a) AFM topography image of Bi2Te3 thin film with 49 locations for nanoscale and (b) Seebeck voltage measurement, as indication by 49 dots in (a)[52] "