Progress on High-throughput Synthesis and Characterization Methods for Thermoelectric Materials

doi:10.15541/jim20180335

Abstract

Abstract:

High-throughput experiments aimed to promptly obtain the relationship among composition-phase-structure-performance with fewer experiments and screen out optimal material systems with optimized compositions. Up to now, high-throughput experiments are successfully applied in superconducting materials, fluorescent materials and giant magnetoresistance materials. Thermoelectric materials are functional materials that can realize the direct conversion between thermal energy and electrical energy and can be potentially applied in the fields of thermoelectric power generation and waste heat utilization. However, traditional preparation and characterization methods for thermoelectric materials have disadvantages of time consuming and low efficiency. Therefore, it is of great theoretical and practical significance to introduce methods and concepts of high-throughput experiments into development and optimization of new thermoelectric materials. In this paper, we summarize and discuss the existing high-throughput experimental preparation and characterization techniques with great application prospects in thermoelectric materials, including high-throughput sample preparation, composition-structure, and electro-thermal transport properties characterization, and then analyze the advantages and limitations of these high-throughput techniques. We hope to provide a reference for future high-throughput optimization and screening of thermoelectric materials.

Key words: high-throughput experiement, thermoelectric materials, electrical transport properties, thermal conductivity, review

CLC Number:

TB34

LUO Jun, HE Shi-Yang, LI Zhi-Li, LI Yong-Bo, WANG Feng, ZHANG Ji-Ye. Progress on High-throughput Synthesis and Characterization Methods for Thermoelectric Materials[J]. Journal of Inorganic Materials, 2019, 34(3): 247-259.

Figures/Tables 22

Fig.1 A 128-member binary library[15]

Fig.2 Schematic diagram of combinatorial electrostatic atomization system “M-ist Combi”[16]

Fig. 3 Schematic illustration for the Czochralski crystal growth[18]

Fig.4 Schematic illustration for the vertical Bridgman crystal growth[19]

Fig.5 Variation of Seebeck coefﬁcient values along n-type 0.01/0.055% PbI2 doped (Pb0.95Sn0.05Te)0.92(PbS)0.08 functionally graded materials[24]

Fig.6 (a) Scheme of a rotor with capsules for sedimentation experiment and (b) mechanism of sedimentation of atoms in the strong acceleration field[25]

Fig.7 (a) Optical image of the annealed Ti-Ni-Sn thin film materials library; (b-d) color-coded results of the high-throughput EDX measurements of the material library[27]

Fig.8 EDX measurements of the concentration of (a)magnesium, (b)nickel and (c)aluminum of an Mg-Ni-Al ternary thin film library[30]

Fig.9 Layout of the nanocalorimeter cell[34]

Fig.10 Composition trends over the sample library, (a) Si:Cu ratio for the glass-forming component, (b) glass transition temperature and (c) the total enthalpy of this glass reaction[35]

Fig.11 (a) Schematic of the pump and probe laser measurement setup and (b)temperature increase as a function of time after a single-pulse[33]

Fig.12 Time-domain thermoreflectance experimental setup[33]

Fig.13 (a)Thermal conductivity imaging of a Cr-Ti diffusion couple and (b) numerical values for thermal conductivity across the path shown as a dashed line in (a)[40]

Fig.14 Schematic illustration of SThM setup[43]

Fig. 15 Quantitative mapping of thermal conductivities, (a) changes in the probe resistance induced by samples with different thermal conductivities; Mappings of (b) resistance change and (c) corresponding thermal conductivities in Yb0.7Co4Sb12; (d) Line scan of resistance change across an interface between different phases[45]

Fig.16 (a) SEM image, (b) AFM topography image, and (c) thermal map image obtained with the SThM technique are shown simultaneously for the same area of the Ag2Se thin film[46]

Fig.17 A photograph of the high temperature thermoelectric power factor screening tool and the Seebeck coefﬁcient probe[14]

Fig.18 Schematics of PSM setup[48]

Fig.19 Thermopower mappings with different thicknesses grown on Si/Au(a)and quartz/Au(b) substrates[49]

Fig.20 Seebeck coefficient distribution of the Bi2Te2Se sample with composition gradient[50]

Fig.21 Schematic diagram of the AFM conductive, heated probe technique for nanoscale Seebeck coefficient characterization[52]

Fig.22 (a) AFM topography image of Bi2Te3 thin film with 49 locations for nanoscale and (b) Seebeck voltage measurement, as indication by 49 dots in (a)[52]

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