Journal of Inorganic Materials ›› 2026, Vol. 41 ›› Issue (7): 947-954.DOI: 10.15541/jim20250410
• RESEARCH ARTICLE • Previous Articles Next Articles
PENG Yuchao1(
), DONG Yuan1, DONG Shun1(
), XIA Liansen1, HU Peitao1, ZHANG Xinghong1, ZHOU Yanchun2
Received:2025-10-21
Revised:2025-12-17
Published:2026-07-20
Online:2025-12-19
Contact:
DONG Shun, professor. E-mail: dongshun@hit.edu.cnAbout author:PENG Yuchao (1999-), male, PhD candidate. E-mail: pycuchao@stu.hit.edu.cn
Supported by:CLC Number:
PENG Yuchao, DONG Yuan, DONG Shun, XIA Liansen, HU Peitao, ZHANG Xinghong, ZHOU Yanchun. Effect of SiC Particle Content on Mechanical Properties and Ablation Resistance of (Ti,Zr,Hf,Ta,Cr)(C,N)-SiC Ceramics[J]. Journal of Inorganic Materials, 2026, 41(7): 947-954.
Fig. 1 XRD patterns of (Ti,Zr,Hf,Ta,Cr)(C,N)-SiC ceramics with various SiCp contents (a) Overall XRD patterns; (b) Enlarged view in the range of 2θ=35o-37o
Fig. 2 SEM images of the polished surfaces of (Ti,Zr,Hf,Ta,Cr)(C,N)-SiC ceramics with various SiCp contents (a) CC-0-SiCp; (b) CC-10-SiCp; (c) CC-15-SiCp; (d) CC-20-SiCp; (e) CC-25-SiCp
Fig. 3 Mechanical properties of (Ti,Zr,Hf,Ta,Cr)(C,N)-SiC ceramics with various SiCp contents and SEM images of indentation morphology and crack propagation in CC-20-SiCp (a) Vickers hardness; (b) Fracture toughness; (c) Indentation morphology; (d-f) Crack propagation paths
Fig. 5 (a) Macroscopic morphologies before and after ablation tests and (b) XRD patterns after ablation tests of (Ti,Zr,Hf,Ta,Cr)(C,N)-SiC ceramics with various SiCp contents
| Sample | Measured density/(g·cm-3) | Theoretical density/(g·cm-3) | Relative density/% |
|---|---|---|---|
| CC-0-SiCp | 8.67 | 8.92 | 97.2 |
| CC-10-SiCp | 8.17 | 8.35 | 97.8 |
| CC-15-SiCp | 7.92 | 8.06 | 98.3 |
| CC-20-SiCp | 7.69 | 7.78 | 98.8 |
| CC-25-SiCp | 7.30 | 7.49 | 97.5 |
Table S1 Measured densities, theoretical densities, and relative densities of (Ti,Zr,Hf,Ta,Cr)(C,N)-SiC ceramics with various SiCp contents
| Sample | Measured density/(g·cm-3) | Theoretical density/(g·cm-3) | Relative density/% |
|---|---|---|---|
| CC-0-SiCp | 8.67 | 8.92 | 97.2 |
| CC-10-SiCp | 8.17 | 8.35 | 97.8 |
| CC-15-SiCp | 7.92 | 8.06 | 98.3 |
| CC-20-SiCp | 7.69 | 7.78 | 98.8 |
| CC-25-SiCp | 7.30 | 7.49 | 97.5 |
| Material system | Fracture toughness/(MPa·m1/2) | Vickers hardness/GPa | Reference |
|---|---|---|---|
| (Hf,Zr,Ta,Nb,Ti)(C,N) | 2.8 | 19.5 | [ |
| (Ti,V,Nb,Ta)(C,N) | 2.64 | 19.7 | [ |
| (Ti,V,Nb,Ta)(C,N) | 2.1 | 20.6 | [ |
| (Ti,V,Nb,Ta)(C,N) | 2 | 19.1 | [ |
| (Ti,Nb,Ta,Mo,W)(C,N) | 3.1 | 23.4 | [ |
| (Ti,Nb,Ta,Mo,W)(C,N) | 2.2 | 26.8 | [ |
| ZrC | 2.8 | 18.2 | [ |
| ZrC | 2.8 | 19 | [ |
| ZrC | 2.6 | 19.6 | [ |
| ZrC | 1.8 | 20.1 | [ |
| TaC | 2.7 | 13.9 | [ |
| HfC | 2.9 | 10.2 | [ |
Table S2 Summary of the mechanical properties data of the UHTCs in this work and those reported in selected references
| Material system | Fracture toughness/(MPa·m1/2) | Vickers hardness/GPa | Reference |
|---|---|---|---|
| (Hf,Zr,Ta,Nb,Ti)(C,N) | 2.8 | 19.5 | [ |
| (Ti,V,Nb,Ta)(C,N) | 2.64 | 19.7 | [ |
| (Ti,V,Nb,Ta)(C,N) | 2.1 | 20.6 | [ |
| (Ti,V,Nb,Ta)(C,N) | 2 | 19.1 | [ |
| (Ti,Nb,Ta,Mo,W)(C,N) | 3.1 | 23.4 | [ |
| (Ti,Nb,Ta,Mo,W)(C,N) | 2.2 | 26.8 | [ |
| ZrC | 2.8 | 18.2 | [ |
| ZrC | 2.8 | 19 | [ |
| ZrC | 2.6 | 19.6 | [ |
| ZrC | 1.8 | 20.1 | [ |
| TaC | 2.7 | 13.9 | [ |
| HfC | 2.9 | 10.2 | [ |
| Sample | Mass ablation rate/(mg·s-1) | Linear ablative rate/(μm·s-1) |
|---|---|---|
| CC-0-SiCp | -5.75 | -4.58 |
| CC-10-SiCp | -2.33 | -2.17 |
| CC-15-SiCp | -1.42 | -1.33 |
| CC-20-SiCp | -0.92 | -1.17 |
| CC-25-SiCp | -1.25 | -2.58 |
Table S3 Mass ablation rates and linear ablative rates of (Ti,Zr,Hf,Ta,Cr)(C,N)-SiC ceramics with various SiCp contents
| Sample | Mass ablation rate/(mg·s-1) | Linear ablative rate/(μm·s-1) |
|---|---|---|
| CC-0-SiCp | -5.75 | -4.58 |
| CC-10-SiCp | -2.33 | -2.17 |
| CC-15-SiCp | -1.42 | -1.33 |
| CC-20-SiCp | -0.92 | -1.17 |
| CC-25-SiCp | -1.25 | -2.58 |
| Material system | Temperature/℃ | Time/s | Mass ablation rate/(mg·s-1) | Linear ablative rate/(μm·s-1) | Reference |
|---|---|---|---|---|---|
| (Ta0.2Hf0.2Zr0.2Ti0.2Nb0.2)C0.8N0.2 | 2227 | 40 | -14.7 | -6.54 | [ |
| (Ti,Zr,Hf,Nb,Ta)C | 2000 | 120 | -3.8 | -3.6 | [ |
| (Ti,Zr,Hf,Nb,Ta)C-SiC | 2000 | 120 | 1.9 | -2.1 | [ |
| Cf/(Ti0.2Zr0.2Hf0.2Nb0.2Ta0.2)C-SiC | 2430 | 30 | 2.6 | 2.89 | [ |
| (Hf,Ta,Zr,Nb)C | 2100 | 60 | 0.66 | -8.5 | [ |
| (Hf,Ta,Zr,Nb)C | 2100 | 120 | 1.41 | -4.8 | [ |
| (Hf0.2Ti0.2Zr0.2Ta0.2Nb0.2)C | 1801 | 30 | -3.03 | -3.33 | [ |
| (Hf0.2Ti0.2Zr0.2Ta0.2Nb0.2)C | 1952 | 30 | -3.4 | -5.63 | [ |
| (Hf0.2Ti0.2Zr0.2Ta0.2Nb0.2)C | 2052 | 40 | -4.95 | -6.75 | [ |
| (Hf,Zr,Ta,Ti)B2 | 1935 | 30 | -1.52 | 0.96 | [ |
| (Hf,Zr,Ta,Ti)B2 | 1990 | 60 | -0.63 | 1.14 | [ |
Table S4 Summary of the ablation performance data of the UHTCs in this work and those reported in selected references
| Material system | Temperature/℃ | Time/s | Mass ablation rate/(mg·s-1) | Linear ablative rate/(μm·s-1) | Reference |
|---|---|---|---|---|---|
| (Ta0.2Hf0.2Zr0.2Ti0.2Nb0.2)C0.8N0.2 | 2227 | 40 | -14.7 | -6.54 | [ |
| (Ti,Zr,Hf,Nb,Ta)C | 2000 | 120 | -3.8 | -3.6 | [ |
| (Ti,Zr,Hf,Nb,Ta)C-SiC | 2000 | 120 | 1.9 | -2.1 | [ |
| Cf/(Ti0.2Zr0.2Hf0.2Nb0.2Ta0.2)C-SiC | 2430 | 30 | 2.6 | 2.89 | [ |
| (Hf,Ta,Zr,Nb)C | 2100 | 60 | 0.66 | -8.5 | [ |
| (Hf,Ta,Zr,Nb)C | 2100 | 120 | 1.41 | -4.8 | [ |
| (Hf0.2Ti0.2Zr0.2Ta0.2Nb0.2)C | 1801 | 30 | -3.03 | -3.33 | [ |
| (Hf0.2Ti0.2Zr0.2Ta0.2Nb0.2)C | 1952 | 30 | -3.4 | -5.63 | [ |
| (Hf0.2Ti0.2Zr0.2Ta0.2Nb0.2)C | 2052 | 40 | -4.95 | -6.75 | [ |
| (Hf,Zr,Ta,Ti)B2 | 1935 | 30 | -1.52 | 0.96 | [ |
| (Hf,Zr,Ta,Ti)B2 | 1990 | 60 | -0.63 | 1.14 | [ |
Fig. S2 SEM images of fractured surfaces and grain size distributions of (Ti,Zr,Hf,Ta,Cr)(C,N)-SiC ceramics with various SiCp contents (a) CC-0-SiCp; (b) CC-10-SiCp; (c) CC-15-SiCp; (d) CC-20-SiCp; (e) CC-25-SiCp
Fig. S3 Macroscopic morphology, SEM images and corresponding EDS element mappings of the surface microstructure for CC-20-SiCp after ablation tests (a) Macroscopic morphology; (b-d) SEM images of (b) central region, (c) transitional region, and (d) edge region;(e) Magnified SEM image of transitional region; (f-l) EDS element mappings
Fig. S4 SEM images and EDS point analysis results of various surface regions on CC-20-SiCp after oxyacetylene ablation testing at 2100 ℃ for 120 s (a-c) Central region; (d-f) Transitional region; (g-i) Edge region
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