Journal of Inorganic Materials

   

High-throughput Microstructural Characterization of xSi-BN Coated SiC Fibers by Combining Scanning Electron Microscopy and Laser Scanning Confocal Microscopy

XU Jialong1, QIN Hao2, LUO Xinyi1, XING Juanjuan1, ZHANG Xiangyu2, GU Hui3   

  1. 1. School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China;
    2. Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 201899, China;
    3. Center of High Pressure Science & Technology Advanced Research, Beijing 100094, China
  • Received:2025-11-12 Revised:2026-02-02
  • About author:XU Jialong (2001–), female, Master candidate. E-mail: xjlong_23@shu.edu.cn
  • Supported by:
    National Key R&D Program of China (2022YFB3707700)

Abstract: BN interphase serves as a key component of SiCf/SiC composite materials. Optimizing its composition and microstructure is essential for enhancing the comprehensive performance and reliability of ceramic matrix composites. In this investigation, we developed an optoelectric combination technology by combining scanning electron microscopy and laser scanning confocal microscopy through calibration and intelligent positioning, which can characterize the same area of the fiber at multiple scales. Key information, such as the surface roughness, micromorphology, and elemental distribution of BN interphase, was obtained. By establishing a unified planar coordinate system, it increased the measurement speed by about 1.1 times, and allowed high-throughput analysis of 20 component sample areas in one hour. The research indicates that the input flow rate of Si precursor increased during preparation, the Si content in the xSi-BN interphase increased while the B content decreased. The introduction of Si leads to a decrease in the crystallinity of BN and an enhancement in its surface activity, thereby facilitating the absorption of oxygen from the air and the formation of protruding particles on the surface. Si doping significantly influences the layered structure and mechanical properties of BN. As the Si content reaches 8%, the “pop-in” phenomenon associated with interlayer sliding disappears, and the hardness of the xSi-BN interphase markedly decreases from 14.91 GPa to 8.06 GPa. At the Si content reaches 11%, the interfacial shear strength increases significantly from 32.76 MPa to 109.07 MPa. This technology provides an effective approach for the microstructural characterization of the compositional design, structural regulation, and performance optimization of the interphase in SiCf/SiC composites.

Key words: scanning electron microscopy, laser scanning confocal microscopy, optoelectric combination high-throughput characterization, BN interphase

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