Journal of Inorganic Materials

   

Preparation of Cu-Mn-I Solid Solution Thin Films and Control of Their p-type Transparent Conductive Properties

WANG Liangjun1, OUYANG Yuzhao1, ZHAO Junliang2, YANG Chang1   

  1. 1. Key Laboratory of Polar Materials and Devices(MOE), Shanghai Center of Brain-inspired Intelligent Materials and Devices, Department of Electronics, East China Normal University, Shanghai 200241, China;
    2. Shanghai Berma Enterprise Development Group Co., Ltd., Shanghai 201306, China
  • Received:2025-01-15 Revised:2025-02-13
  • About author:WANG Liangjun (1998–), male, PhD candidate. E-mail: 1134420548@qq.com
  • Supported by:
    National Natural Science Foundation of China (62074056, 62474066); Fundamental Research Funds for the Central Universities; Shanghai Pujiang Programme (2023PJD028)

Abstract: In the field of optoelectronic devices, p-type transparent semiconductor materials with controllable electrical properties hold significant application value. CuI, as a representative material, still faces considerable technical challenges in terms of preparation processes and doping control. This study successfully developed a new p-type transparent semiconductor material with adjustable electrical properties through manganese cation doping, offering a new approach for the advancement of transparent electronics. The Cu1-xMnxI solid solution film, prepared via reactive magnetron sputtering, demonstrates unique performance advantages. First, the material can be fabricated at room temperature while maintaining excellent visible light transparency. Second, as the manganese doping concentration (x) increases, the grain size of the film gradually decreases, and pronounced crystal cluster aggregation is observed at higher doping concentrations. X-ray photoelectron spectroscopy analysis reveals that manganese ions in the film exist in a mixed valence state of Mn2+ and Mn3+. Electrical performance characterization shows that the resistivity of the film can be tuned over two orders of magnitude, ranging from 0.02 to 2.5 Ω·cm, while the hole carrier concentration remains stable at a high level of 1018-1019 cm-3. Unlike the n-type doping behavior observed in traditional semiconductors, the introduction of high-valent manganese ions does not significantly affect the p-type conductivity of the material. This is likely due to the partially localized electronic state formed when manganese replaces cuprous ions. This discovery suggests that the hole conductivity of CuI semiconductors is not easily affected by high-valent manganese ion doping, enabling a wide range of compositional adjustments while maintaining stable p-type conductivity. This provides a valuable material basis for the development of CuI-based multifunctional transparent electronic devices.

Key words: Cu1-xMnxI, transparent p-type semiconductor, controllable p-type resistivity

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