Journal of Inorganic Materials ›› 2012, Vol. 27 ›› Issue (5): 550-554.DOI: 10.3724/SP.J.1077.2012.11743

• Orginal Article • Previous Articles     Next Articles

Microstructure Characterization and Thermal Conductivity Analysis of Plasma Sprayed ZrO2 Coatings

WANG Yong-Zhe1, WU Wei1, HUA Jia-Jie1, ZENG Yi1, ZHENG Xue-Bin2, ZHOU Ying3, WANG Hu3   

  1. (1. The State Key Lab of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China; 2. Key Laboratory of Inorganic Coating Materials, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China; 3. Shanghai Institute of Measurement and Testing Technology, Shanghai 201203, China)
  • Received:2011-12-02 Published:2012-05-10 Online:2012-03-31
  • About author:WANG Yong-Zhe(1985-), male, candidate of master degree. E-mail: yongzhew@student.sic.ac.cn
  • Supported by:
    Foundation item: Science and Technology Innovation Project of Shanghai Institute of Ceramics(Y17ZC5150G);Research Fund for Nanomaterials of Shanghai (11nm0506900)

Abstract:

Yttria stabilized zirconia coatings were deposited using two different sets of parameters (N1, N2 coating). The microstructure features, such as total porosity and large porosity, were quantified by means of scanning electron microscope and image analysis. The three-dimensional distribution of microcracks and segmentation cracks was successfully revealed by the X-ray microscopy in the scanning electron microscope with three-dimensional microtomography capability. So the relationship between microstructure and thermal conductivity was found. At room temperature, thermal conductivity of N2 was lower than that of N1 due to larger pores and microcracks. At 1000℃ thermal conductivity of N1 was lower for the sintering of microcracks. The segmentation cracks formed by the propagation of microcracks could effectively reduce the thermal conductivity at high temperature.

Key words: ZrO2 coatings, microstructure, thermal conductivity, X-ray microscopy

CLC Number: