Journal of Inorganic Materials ›› 2021, Vol. 36 ›› Issue (7): 685-694.DOI: 10.15541/jim20200440
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XIAO Peng1(), ZHU Yulin2, WANG Song1(
), YU Yiping1, LI Hao1
Received:
2020-08-10
Revised:
2020-10-10
Published:
2021-07-20
Online:
2020-10-30
Contact:
WANG Song, professor. E-mail:wangs_0731@163.com
About author:
XIAO Peng(1991-)male, PhD candidate. E-mail:xspi3@126.com
CLC Number:
XIAO Peng, ZHU Yulin, WANG Song, YU Yiping, LI Hao. Research Progress on the Preparation and Characterization of Ultra Refractory TaxHf1-xC Solid Solution Ceramics[J]. Journal of Inorganic Materials, 2021, 36(7): 685-694.
Solid solution between metal carbides | Carbonization reaction of metals | Carbothermal reduction of metal oxides | |
---|---|---|---|
Advantages | Easy to operate; products have high purity and could achieve densification simultaneously | High temperature is not necessary; the whole process lasts only several seconds, not time consuming | Easy to operate; raw materials are cheap; have potential to synthesize single-phase products with fine grain size at relatively low temperature |
Disadvantages | Needs high temperature and long time; products are not single-phase solid solution with elements uneven distribution | The reaction process are unable to control; products are usually not pure | The phase and microstructure of products are closely related to the distribution and binding state of oxides and carbon |
Table 1 Advantages and disadvantages of different techniques for preparation of TaxHf1-xC powder
Solid solution between metal carbides | Carbonization reaction of metals | Carbothermal reduction of metal oxides | |
---|---|---|---|
Advantages | Easy to operate; products have high purity and could achieve densification simultaneously | High temperature is not necessary; the whole process lasts only several seconds, not time consuming | Easy to operate; raw materials are cheap; have potential to synthesize single-phase products with fine grain size at relatively low temperature |
Disadvantages | Needs high temperature and long time; products are not single-phase solid solution with elements uneven distribution | The reaction process are unable to control; products are usually not pure | The phase and microstructure of products are closely related to the distribution and binding state of oxides and carbon |
Fig. 1 (a) XRD patterns of Ta0.8Hf0.2C solid solution ceramic before and after SPS at different temperatures and (b) more detailed diffraction patterns between 30° and 45°[32]
Fig. 2 Morphology of Ta0.8Hf0.2C solid solution ceramics synthesised by different SHS methods[43] (a,b) Mixed Ta, Hf and carbon black simultaneously; (c,d) Mixed Hf and carbon black first
Raw powder | Sintering method | Relative density/% | Hardness/GPa | Elastic modulus/GPa | KIC/(MPa·m1/2) | Ref. | |
---|---|---|---|---|---|---|---|
Ta0.9Hf0.1C-12vol% MoSi2 | TaC, HfC, MoSi2 | SPS | 100.0 | (15.0±0.2) | — | (3.2±0.3) | [26] |
Ta0.9Hf0.1C-12vol% TaSi2 | TaC, HfC, TaSi2 | SPS | 100.0 | (15.9±0.3) | — | (3.3±0.2) | [26] |
Ta0.87Hf0.13C | TaC, HfC | HIP | >98.0 | 24.1 | 575.4 | — | [3] |
Ta0.8Hf0.2C | Ta0.8Hf0.2C | HP | 99.6 | (30.3±1.6) | (462.5±3.1) | (2.2±0.4) | [30] |
Ta0.8Hf0.2C | TaxHf1-xC | HP | 94.4 | 27.2 | 491.7 | 3.0 | [21] |
Ta0.8Hf0.2C | TaC, HfC | SPS | 97.8 | (16.7±0.9) | (443.2±23.7) | (4.6±1.1) | [40] |
Ta0.8Hf0.2C | TaC, HfC | SPS | (97.7±0.1) | (19.3±1.3) | (459.0±5.8) | (2.9±0.9) | [32] |
Ta0.8Hf0.2C-10vol% MoSi2 | TaC, HfC, MoSi2 | SPS | 99.8 | (18.5±0.5) | (482.0±2.0) | (4.2±0.2) | [29] |
Ta0.8Hf0.2C-12vol% MoSi2 | TaC, HfC, MoSi2 | SPS | 100.0 | (15.2±0.5) | — | (3.9±0.2) | [26] |
Ta0.8Hf0.2C-12vol% TaSi2 | TaC, HfC, TaSi2 | SPS | 100.0 | (17.7±0.4) | — | (3.2±0.1) | [26] |
Ta0.75Hf0.25C | TaC, HfC | HIP | >98.0 | 28.6 | 567.7 | — | [3] |
Ta0.7Hf0.3C-12vol% MoSi2 | TaC, HfC, MoSi2 | SPS | 97.8 | (15.9±0.6) | — | (3.9±0.1) | [26] |
Ta0.7Hf0.3C-12vol% TaSi2 | TaC, HfC, TaSi2 | SPS | 98.9 | (18.2±0.7) | — | (2.8±0.1) | [26] |
Ta0.67Hf0.33C | Ta0.67Hf0.33C | HP | 95.3 | 29.7 | 483.0 | 2.5 | [21] |
Ta0.5Hf0.5C | Ta0.5Hf0.5C | HP | 99.2 | (36.7±1.2) | (559.3±6.5) | (2.9±0.4) | [30] |
Ta0.5Hf0.5C | Ta0.5Hf0.5C | HP | 97.9 | 37.9 | 591.0 | 2.5 | [21] |
Ta0.5Hf0.5C | TaC, HfC | SPS | 98.2 | (17.1±1.1) | (523.8±7.0) | (6.0±0.7) | [40] |
Ta0.5Hf0.5C | TaC, HfC | SPS | (95.7±0.3) | (22.1±1.8) | (549.0±11.2) | (2.9±0.7) | [32] |
Ta0.5Hf0.5C | TaC, HfC | HIP | >97.0 | 23.5 | 469.9 | — | [3] |
Ta0.3Hf0.7C | HfO2, Ta2O5, graphite | SPS | 98.7 | (20.0±0.9) | — | (5.2±0.2) | [48] |
Ta0.25Hf0.75C | Ta0.25Hf0.75C | HP | 96.5 | (29.9±2.2) | (436.4±13.8) | (2.2±0.2) | [30] |
Ta0.25Hf0.75C | TaC, HfC | HIP | >98.0 | 29.1 | 593.5 | — | [3] |
Ta0.2Hf0.8C | Ta0.2Hf0.8C | HP | 95.9 | (35.1±1.1) | (554.7±8.8) | (2.3±0.5) | [21] |
Ta0.2Hf0.8C | TaC, HfC | SPS | (87.0±0.2) | (16.7±3.0) | (438.0±17.8) | (3.4±0.6) | [32] |
Ta0.2Hf0.8C | TaC, HfC | SPS | 98.8 | (19.1±0.3) | (577.3±6.0) | (5.5±0.6) | [40] |
Ta0.2Hf0.8C | HfO2, Ta2O5, graphite | SPS | 100.0 | (19.7±0.7) | — | 5.1 | [48] |
Ta0.17Hf0.83C | TaC, HfC | HIP | >98.0 | 26.6 | 534.2 | — | [3] |
Ta0.1Hf0.9C | HfO2, Ta2O5, graphite | SPS | 99.3 | (19.7±0.8) | — | — | [48] |
Table 2 Mechanical properties of TaxHf1-xC solid solution ceramics at room temperature
Raw powder | Sintering method | Relative density/% | Hardness/GPa | Elastic modulus/GPa | KIC/(MPa·m1/2) | Ref. | |
---|---|---|---|---|---|---|---|
Ta0.9Hf0.1C-12vol% MoSi2 | TaC, HfC, MoSi2 | SPS | 100.0 | (15.0±0.2) | — | (3.2±0.3) | [26] |
Ta0.9Hf0.1C-12vol% TaSi2 | TaC, HfC, TaSi2 | SPS | 100.0 | (15.9±0.3) | — | (3.3±0.2) | [26] |
Ta0.87Hf0.13C | TaC, HfC | HIP | >98.0 | 24.1 | 575.4 | — | [3] |
Ta0.8Hf0.2C | Ta0.8Hf0.2C | HP | 99.6 | (30.3±1.6) | (462.5±3.1) | (2.2±0.4) | [30] |
Ta0.8Hf0.2C | TaxHf1-xC | HP | 94.4 | 27.2 | 491.7 | 3.0 | [21] |
Ta0.8Hf0.2C | TaC, HfC | SPS | 97.8 | (16.7±0.9) | (443.2±23.7) | (4.6±1.1) | [40] |
Ta0.8Hf0.2C | TaC, HfC | SPS | (97.7±0.1) | (19.3±1.3) | (459.0±5.8) | (2.9±0.9) | [32] |
Ta0.8Hf0.2C-10vol% MoSi2 | TaC, HfC, MoSi2 | SPS | 99.8 | (18.5±0.5) | (482.0±2.0) | (4.2±0.2) | [29] |
Ta0.8Hf0.2C-12vol% MoSi2 | TaC, HfC, MoSi2 | SPS | 100.0 | (15.2±0.5) | — | (3.9±0.2) | [26] |
Ta0.8Hf0.2C-12vol% TaSi2 | TaC, HfC, TaSi2 | SPS | 100.0 | (17.7±0.4) | — | (3.2±0.1) | [26] |
Ta0.75Hf0.25C | TaC, HfC | HIP | >98.0 | 28.6 | 567.7 | — | [3] |
Ta0.7Hf0.3C-12vol% MoSi2 | TaC, HfC, MoSi2 | SPS | 97.8 | (15.9±0.6) | — | (3.9±0.1) | [26] |
Ta0.7Hf0.3C-12vol% TaSi2 | TaC, HfC, TaSi2 | SPS | 98.9 | (18.2±0.7) | — | (2.8±0.1) | [26] |
Ta0.67Hf0.33C | Ta0.67Hf0.33C | HP | 95.3 | 29.7 | 483.0 | 2.5 | [21] |
Ta0.5Hf0.5C | Ta0.5Hf0.5C | HP | 99.2 | (36.7±1.2) | (559.3±6.5) | (2.9±0.4) | [30] |
Ta0.5Hf0.5C | Ta0.5Hf0.5C | HP | 97.9 | 37.9 | 591.0 | 2.5 | [21] |
Ta0.5Hf0.5C | TaC, HfC | SPS | 98.2 | (17.1±1.1) | (523.8±7.0) | (6.0±0.7) | [40] |
Ta0.5Hf0.5C | TaC, HfC | SPS | (95.7±0.3) | (22.1±1.8) | (549.0±11.2) | (2.9±0.7) | [32] |
Ta0.5Hf0.5C | TaC, HfC | HIP | >97.0 | 23.5 | 469.9 | — | [3] |
Ta0.3Hf0.7C | HfO2, Ta2O5, graphite | SPS | 98.7 | (20.0±0.9) | — | (5.2±0.2) | [48] |
Ta0.25Hf0.75C | Ta0.25Hf0.75C | HP | 96.5 | (29.9±2.2) | (436.4±13.8) | (2.2±0.2) | [30] |
Ta0.25Hf0.75C | TaC, HfC | HIP | >98.0 | 29.1 | 593.5 | — | [3] |
Ta0.2Hf0.8C | Ta0.2Hf0.8C | HP | 95.9 | (35.1±1.1) | (554.7±8.8) | (2.3±0.5) | [21] |
Ta0.2Hf0.8C | TaC, HfC | SPS | (87.0±0.2) | (16.7±3.0) | (438.0±17.8) | (3.4±0.6) | [32] |
Ta0.2Hf0.8C | TaC, HfC | SPS | 98.8 | (19.1±0.3) | (577.3±6.0) | (5.5±0.6) | [40] |
Ta0.2Hf0.8C | HfO2, Ta2O5, graphite | SPS | 100.0 | (19.7±0.7) | — | 5.1 | [48] |
Ta0.17Hf0.83C | TaC, HfC | HIP | >98.0 | 26.6 | 534.2 | — | [3] |
Ta0.1Hf0.9C | HfO2, Ta2O5, graphite | SPS | 99.3 | (19.7±0.8) | — | — | [48] |
Fig. 6 Morphologies of Hf6Ta2O17-Ta2O5 eutectic structure[6] (a) STEM imagies and associated EDS element mapping; (b) HRTEM image and corresponding SAED pattern of area 2; (c) HRTEM image and corresponding SAED pattern of area 1; (d) HRTEM image of area 3; (e) SAED pattern of area 3
Fig. 7 Morphologies of Ta0.25Hf0.75C ceramic after oxidation[6] (a,b) SEM image of oxide scale; (c) STEM image of transition layer; (d) STEM and SAED results for transition layer; (e) STEM and SAED results for unaffected layer; (f) STEM result for border area of transition layer and unaffected layer
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