[1] Hu J H, Gordon R G. J. Electrochem. Soc., 1992, 139: 2014--2022. [2] Barkers A, Crowther S, Rees D. Sensors Actuators A, 1997, 58: 229--235. [3] Hamdani F, Yeadon M, Smith D J, et al. J. Appl. Phys., 1998, 83: 983--990. [4] Hummer K. Phys. Stat. Sol. B, 1973, 56: 249--260. [5] Dietl T, Ohno H, Matsukura F, et al. Science, 2000, 287: 1019--1022. [6] Sato K, Katayama-Yoshida H. Physica E (Amsterdam), 2001, 10: 251--255. [7] Gratens X, Bindilatti V, Oliveira N F, et al. Phys. Rev. B, 2004, 69: 125209--125220. [8] Spaldin N A. Phys. Rev. B, 2004, 69: 125201--125207. [9] Wang Q, Jena P. Appl. Phys. Lett., 2004, 84: 4170--4172. [10] Jung S W, An S J, Yi G C, et al. Appl. Phys. Lett., 2002, 80: 4561--4563. [11] Norton D P, Pearton S J, Hebard A F, et al. Appl. Phys. Lett., 2003, 82: 239--241. [12] Sharma P, Gupta A, Rao K V, et al. Nat. Mater., 2003, 2: 673--677. [13] Cong C J, Liao L, Li J C, et al. Nanotechnology, 2005, 16: 981--984. [14] Chen Q W, Zhu D L, Zhang Y H. Appl. Phys. Lett., 2000, 77: 854--856. [15] Wagner C D, Riggs W M, Davis L E, et al. Handbook of X-ray Photoelectron Spectroscopy. Perking-Elmer Corporation,Physical Electronics Division. [16] Briggs D, Seah M P. Pratical Surface Analysis vol.1, 2ed.,Wiley, New York, 1993. [17] Wan X H, Wei S Q. USTCXAFS Software Package,1999. [18] Maiti U N, Ghosh P K, Nandy S, et al. Physica B: Condensed Matter, 2007, 387: 103--108. [DOI: 10.1016/j.physb.2006.03.090]. [19] Zhang H W, Shi E W, Chen Z Z, et al. J. Magn. Magn. Mater., 2006, 35 (2): 377--380. [DOI: 10.1016/j.jmmm.2006.01.108] [20] 徐彭寿, 孙玉明, 施朝淑, 等, 中国科学 A, 2001, 31 (4): 358--365. [21] Viswanatha R, Sapra S, Gupta S S, et al. J. Phys. Chem. B, 2004, 108: 6303--6310. [22] Li J H, Shen D Z, Zhang J Y, et al. J. Lumin., 2007, 122-123: 352-354. [DOI: 10.1016/j.jlumin.2006.01.182] [23] 孙 柏, 邹崇文, 刘忠良, 等(SUN Bai, et al). 无机材料学报(Journal of Inorganic Materials), 2006, 21 (4): 1005--1010. [24] Mo C M, Li Y H, Lin Y S, et al. J. Appl. Phys., 1998, 83: 4389--4391. [25] Borgohain K, Mahamuni S. Semicond. Sci. Technol., 1998, 13: 1154--1157. [26] Mahamuni, S, Borgohain K, Bendre B S, et al. J. Appl. Phys., 1999, 85: 2861--2865. [27] Wong E M, Searcon P C. Appl. Phys. Lett., 1999, 74: 2939--2941. [28] Guo L, Yang S H, Yang C L. Appl. Phys. Lett., 2000, 76: 2901--2903. [29] Studenikin S A, Golego N, Cocivera M. J. Appl. Phys., 1998, 84: 2287--2294. [30] Haase M, Weller H, Henglein A. J. Phys. Chem., 1988, 92: 482--487. [31] Spanhel L, Anderson M A. J. Am. Chem. Soc., 1991, 113: 2826--2833. [32] Guo L, Yang S H, Yang C L, et al. Chem. Mater., 2000, 12: 2268--2274. [33] Zhang X T, Liu Y C, Zhang J Y, et al. J. Cryst. Growth, 2003, 254: 80--85. |