Journal of Inorganic Materials ›› 2021, Vol. 36 ›› Issue (6): 570-578.DOI: 10.15541/jim20200361
Special Issue: 能源材料论文精选(2021); 【虚拟专辑】太阳能电池(2020~2021)
• REVIEW • Previous Articles Next Articles
WU Xiaowei1,2(
), LI Jiayan1,2(
)
Received:2020-06-30
Revised:2020-08-30
Published:2021-06-20
Online:2020-10-10
Contact:
LI Jiayan, associate professor. E-mail: lijiayan@dlut.edu.cn
About author:WU Xiaowei(1991-), male, PhD candidate. E-mail: wuxiaowei261@163.com
Supported by:CLC Number:
WU Xiaowei, LI Jiayan. Texturing Technology on Multicrystalline Silicon Wafer by Metal-catalyzed Chemical Etching: a Review[J]. Journal of Inorganic Materials, 2021, 36(6): 570-578.
Fig. 6 (a) Schematic illustration of the main steps to prepare the submicron-in-micron (SIM) texture on the DWS mc-Si wafer and (b) experimental reflectance (curves) and simulated reflectance (scatter points) of three samples[33]
Fig. 7 Surface and cross-sectional SEM images of mc-Si grains after etching by alkali, Ag-MCCE and post-etching with different orientations[34] (a) (100); (b) (110); (c) (111)
Fig. 8 SEM images of Si nanostructures produced by Cu-MCCE method (a,b) before and (c,d) after the post-processing treatment and (e) schematic diagram of post-processing treatment[41]
Fig. 9 Cross-sectional SEM images of Si wafers after (a) Ag-MCCE and (b) Cu-MCCE, and (c) schematics of etching process by single Cu- and Ag-catalyzed chemical etching and Ag/Cu-cocatalyzed chemical etching[45]
| Catalyst | Method | Ra | ηb | Ref. |
|---|---|---|---|---|
| Ag | Ag-MCCE + HF/HNO3+NaOH | 15.9% | 18.45% | [ |
| Ag | Artificial defects (HF/HNO3/AgNO3)+HF/HNO3 | 19% | 19.07% | [ |
| Ag | Alkali etching+Ag-MCCE+post etching | 16.85% | 19.4% | [ |
| Ag | Ag deposition (additive)+etching | 16.04% | 19.51% | [ |
| Ag | Ag deposition+etching (additive) | 18.17% | 19.56% | [ |
| Ag | HF/HNO3+Ag-MCCE+RIE | - | 20.69% | [ |
| Ag | Ag-MCCE | 23.7% | 20.89% | [ |
| Ag | Ag-MCCE+Modification by acid etching | 19.46% | 19.07% | [ |
| Ag | HF/HNO3+Ag-MCCE+NSR process | 8.26% | 17.96% | [ |
| Ag | HF/HNO3+Ag-MCCE+HF/HNO3 | 18.4% | 18.7% | [ |
| Cu | Cu-MCCE+post etching (HF/HNO3/H3PO4) | - | 18.88% | [ |
| Cu | Cu-MCCE+HF/HNO3 | 18.21% | 19.06% | [ |
| Cu | Cu-MCCE | 22.4% | 19.03% | [ |
| Ag-Cu | Cu/Ag-MCCE | 12.08% | 19.49% | [ |
| Ag-Cu | Alkali pretreatment (additive)+Cu/Ag-MCCE+post etching | 15.52% | 18.91% | [ |
| Ag-Cu | Cu/Ag-MCCE + NSR (H2O2/NaF) | 16.50% | 18.71% | [ |
| Ag-Cu | Cu/Ag-MCCE + NSR (H2O2/NaF) | 16.85% | 19.10% | [ |
| Ni | Ni-MCCE | - | 16.60% | [ |
| Cu-Ni | Cu/Ni-MCCE (Cu(NO3)2+NiSO4+HF+H2O2) | 18.53% | - | [ |
Table 1 Performances for texture surfaces of DWS cut multicrystalline silicon prepared via different MCCE methods
| Catalyst | Method | Ra | ηb | Ref. |
|---|---|---|---|---|
| Ag | Ag-MCCE + HF/HNO3+NaOH | 15.9% | 18.45% | [ |
| Ag | Artificial defects (HF/HNO3/AgNO3)+HF/HNO3 | 19% | 19.07% | [ |
| Ag | Alkali etching+Ag-MCCE+post etching | 16.85% | 19.4% | [ |
| Ag | Ag deposition (additive)+etching | 16.04% | 19.51% | [ |
| Ag | Ag deposition+etching (additive) | 18.17% | 19.56% | [ |
| Ag | HF/HNO3+Ag-MCCE+RIE | - | 20.69% | [ |
| Ag | Ag-MCCE | 23.7% | 20.89% | [ |
| Ag | Ag-MCCE+Modification by acid etching | 19.46% | 19.07% | [ |
| Ag | HF/HNO3+Ag-MCCE+NSR process | 8.26% | 17.96% | [ |
| Ag | HF/HNO3+Ag-MCCE+HF/HNO3 | 18.4% | 18.7% | [ |
| Cu | Cu-MCCE+post etching (HF/HNO3/H3PO4) | - | 18.88% | [ |
| Cu | Cu-MCCE+HF/HNO3 | 18.21% | 19.06% | [ |
| Cu | Cu-MCCE | 22.4% | 19.03% | [ |
| Ag-Cu | Cu/Ag-MCCE | 12.08% | 19.49% | [ |
| Ag-Cu | Alkali pretreatment (additive)+Cu/Ag-MCCE+post etching | 15.52% | 18.91% | [ |
| Ag-Cu | Cu/Ag-MCCE + NSR (H2O2/NaF) | 16.50% | 18.71% | [ |
| Ag-Cu | Cu/Ag-MCCE + NSR (H2O2/NaF) | 16.85% | 19.10% | [ |
| Ni | Ni-MCCE | - | 16.60% | [ |
| Cu-Ni | Cu/Ni-MCCE (Cu(NO3)2+NiSO4+HF+H2O2) | 18.53% | - | [ |
| Method | Advantages | Disadvantages | η |
|---|---|---|---|
| Ag-MCCE | Mature technology, easy to form nanostructure, stable performance | High cost, difficult to recycle waste liquid | 20.89% |
| Cu-MCCE | Low cost, easy to remove residual Cu, significantly reduce the impact of saw marks | Easy to form the dense film, decreased etching rate, essential oxidants | 19.06% |
| MCCE-additive | Uniform size, stable performance | Organic compounds increasing the cost of waste liquid treatment | 19.56% |
| Composite MCCE | Composite structure | Complicated process, and difficult to recycle the waste liquid | 19.49% |
| Other metal-MCCE | Low cost, composite structure | Inmature | 16.60% |
Table 2 Comparison of making texture surface on DWS cut multicrystalline silicon by different MCCE methods
| Method | Advantages | Disadvantages | η |
|---|---|---|---|
| Ag-MCCE | Mature technology, easy to form nanostructure, stable performance | High cost, difficult to recycle waste liquid | 20.89% |
| Cu-MCCE | Low cost, easy to remove residual Cu, significantly reduce the impact of saw marks | Easy to form the dense film, decreased etching rate, essential oxidants | 19.06% |
| MCCE-additive | Uniform size, stable performance | Organic compounds increasing the cost of waste liquid treatment | 19.56% |
| Composite MCCE | Composite structure | Complicated process, and difficult to recycle the waste liquid | 19.49% |
| Other metal-MCCE | Low cost, composite structure | Inmature | 16.60% |
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