高级检索
无机材料学报

无机材料学报

• 研究论文 • 上一篇    下一篇

(Zr0.7Sn0.3)TiO4陶瓷介电性能与工艺参数关系的回归分析

王国庆; 吴顺华; 赵玉双; 刘丹丹   

  1. 天津大学电子信息工程学院 天津 300072
  • 收稿日期:2002-06-13 修回日期:2002-07-17 出版日期:2003-07-20 网络出版日期:2003-07-20

Regression Analysis of the Relationship between Dielectric Properties and Processing Parameters of (Zr0.7Sn0.3)TiO4 Ceramics

WANG Guo-Qing; WU Shun-Hua; ZHAO Yu-Shuang; LIU Dan-Dan   

  1. College of Electronics and Information Engineering; Tianjin University; Tianjin 300072; China
  • Received:2002-06-13 Revised:2002-07-17 Published:2003-07-20 Online:2003-07-20

PDF (PC)

1159

摘要： 用回归分析方法得到了(Zr0.7Sn0.3)TiO4陶瓷的介电性能ε和δ与其工艺参数(CuO、ZnO)和玻璃的添加量(分别为x1、x2、x3 wt％)及预烧和烧结温度(分别为x4×103和x5×103℃)之间的定量关系:ε=10.9731-1.4559 x1+9.9154 x2+1.9776x3-3.3160x22-0.2286x32-200.1697x42-161.9102x52+375.1160x4x5;1g(tanδ)=-38.5876-0.6452x2+0.1235x3+31.2221x4+30.3861x5+0.1100x12+0.2077x22-0.0106x32-27.4317x4x5。能对给定工艺参数下的介电性能进行预测,并能确定满足特定介电性能的工艺参数,有助于加快电子陶瓷材料的研究。

关键词: 回归分析, （Zr0.7Sn0.3）TiO4, 介电性能

Abstract: Regression analysis was used to obtain the quantitative relationship between the dielectric properties
(ε and tanδ) and processing parameters of (Zr0.7Sn0.3)TiO4 ceramics, which include doping rates of CuO, ZnO and glass (x1, x2
and x3 wt%, respectively), the calcination and sintering (x4×103 and x5×103℃, respectively) temperatures: ε=10.9731-1.4559x1+9.9154x2+1.9776x3-3.3160x22-0.2286x23-
200.1697x24-161.9102x25+375.1160x4x5; lg(tanδ)=-38.5876-0.6452x2+0.1235x3+31.2221x4+30.3861x5+0.1100x21+0.2077x22-0.0106x23-27.4317x4x5. It is possible to predict the dielectric properties under
given processing parameters, and to determine the processing parameters that satisfy certain dielectric properties. This helps to accelerate the
investigation of electric ceramic materials.

Key words: regression analysis, （Zr0.7Sn0.3）TiO4, dielectric properties

中图分类号: