Journal of Inorganic Materials ›› 2019, Vol. 34 ›› Issue (3): 269-278.DOI: 10.15541/jim20180248
Special Issue: 热电材料与器件
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HU Xiao-Kai1,4, ZHANG Shuang-Meng1, ZHAO Fu1,2, LIU Yong1,3, LIU Wei-Shu1
Received:
2018-06-21
Revised:
2018-08-23
Published:
2019-03-20
Online:
2019-02-26
Supported by:
CLC Number:
HU Xiao-Kai, ZHANG Shuang-Meng, ZHAO Fu, LIU Yong, LIU Wei-Shu. Thermoelectric Device: Contact Interface and Interface Materials[J]. Journal of Inorganic Materials, 2019, 34(3): 269-278.
T range /℃ | Compositions/wt% | Liquidus T/℃ | Solidus T/℃ |
---|---|---|---|
100-200 | 52 In+48 Sn | 118 | 118 |
85 Sn+10 Bi+5 Zn | 190 | 168 | |
63 Sn+37 Pb | 183 | 183 | |
91.2 Sn+8.8 Zn | 198.5 | 198.5 | |
200-300 | 50 Sn+50 Pb | 212 | 183 |
96.5 Sn+3 Ag+0.5 Cu | 220 | 217 | |
95 Sn+5 Sb | 240 | 232 | |
300-400 | 5 Sn+95 Pb | 312 | 305 |
95 Pb+5 Ag | 364 | 305 | |
75 Sn+0.25 Sb+ 0.25 Bi+24.5 Pb | 380 | 370 | |
400-500 | 94 Sn+0.2 Pb+5.8 Sb | 461 | 450 |
88 Pb+11.75 Sb+0.25 Bi | 473 | 473 | |
500-600 | 97 Pb+0.4 Sb + 2.35 Ag+0.25 Bi | 580 | 580 |
8.5 Sn+90 Pb+1.5 Ag | 588 | 588 |
Table 1 Compositions of some solders as well as the temperature (T) at liquidus and solidus[16]
T range /℃ | Compositions/wt% | Liquidus T/℃ | Solidus T/℃ |
---|---|---|---|
100-200 | 52 In+48 Sn | 118 | 118 |
85 Sn+10 Bi+5 Zn | 190 | 168 | |
63 Sn+37 Pb | 183 | 183 | |
91.2 Sn+8.8 Zn | 198.5 | 198.5 | |
200-300 | 50 Sn+50 Pb | 212 | 183 |
96.5 Sn+3 Ag+0.5 Cu | 220 | 217 | |
95 Sn+5 Sb | 240 | 232 | |
300-400 | 5 Sn+95 Pb | 312 | 305 |
95 Pb+5 Ag | 364 | 305 | |
75 Sn+0.25 Sb+ 0.25 Bi+24.5 Pb | 380 | 370 | |
400-500 | 94 Sn+0.2 Pb+5.8 Sb | 461 | 450 |
88 Pb+11.75 Sb+0.25 Bi | 473 | 473 | |
500-600 | 97 Pb+0.4 Sb + 2.35 Ag+0.25 Bi | 580 | 580 |
8.5 Sn+90 Pb+1.5 Ag | 588 | 588 |
Fig. 4 Schematic diagram of a scanning voltage probe for contact resistance measurement, and a Bi2Te3-based leg (inset) (a); contact resistance measurement for both n-type Ni/Bi2Te2.7Se0.3/Ni and p-type Ni/Bi0.4Sb1.6Te3/Ni(b)[21]
Fig.5 Comparison of composition profile between Ni/Bi0.4Sb1.6Te3 interface (a)and Ni/Bi2Te2.7Se0.3Interface (b) obtained from a selected area SEM-EDS[21]IRL: interface reaction layer, TDR: Te-deficient region
Fig.9 (a) Power generation efficiency of segmented BT/SKD modules and (b) scanning electron microscopy image of SKD/Ti0.88Al0.12/Ni interface and electrode on hot side[13]
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