Microstructure and Microwave Dielectric Property of (1-x)(Sr0.2Nd0.208Ca0.488)TiO3-xNd(Ti0.5Mg0.5)O3 Ceramics with High Quality Factor

doi:10.15541/jim20150155

Abstract

Abstract:

(1-x)(Sr_0.2Nd_0.208Ca_0.488)TiO₃-xNd(Ti_0.5Mg_0.5)O₃(0.3≤ x ≤0.4, SNCT-NTMx) ceramics were prepared by solid sate reaction technique. In addition, the crystal structure, microstructures, sintering properties, and microwave dielectric properties of the SNCT-NTMx ceramics were investigated. These results showed that an orthorhombic perovskite structure with a minor amount of unknown secondary phase was formed in the ceramics with the compositions of 0.3≤ x ≤0.35. Additionally, the content of the second phase gradually increased with increasing x value to 0.4. For the SNCT-NTMx ceramics with an increase in NTM content, the dielectric constant (ε_r) decreased, while the quality factor (Q×f) effectively improved, and the temperature coefficient of resonant frequencies (τ_f) gradually shifted to negative direction. An optimized microwave dielectric properties with ε_r~ 50.1, Q×f ~ 44, 910 GHz and τ_f~ -1.7×10^-6/℃ could be obtained for the ceramics with x = 0.35 after being sintered at 1520℃ for 4 h.

Key words: (Sr0.2Nd0.208Ca0.488)TiO3, Nd(Ti0.5Mg0.5)O3, perovskite, microwave dielectric properties

CLC Number:

TM277

QU Jing-Jing, WEI Xing, JING Ben-Qin, LIU Fei, YUAN Chang-Lai. Microstructure and Microwave Dielectric Property of (1-x)(Sr_0.2Nd_0.208Ca_0.488)TiO₃-xNd(Ti_0.5Mg_0.5)O₃ Ceramics with High Quality Factor[J]. Journal of Inorganic Materials, 2015, 30(11): 1213-1217.

Figures/Tables 5

Fig. 1 XRD patterns of SNCT-NTMx(0.3≤x≤0.4) specimens sintered at 1520℃ for 4 h The inset represents the enlarged figures of the (121) peaks

Table 1 Lattice parameters, unit cell volume and dielectric properties of the SNCT-NTMx (0.3≤ x ≤0.4) ceramics sintered at 1520℃ for 4 h

x	a /nm	b / nm	c/ nm	Unit cell volume/nm³	ε_r	Q×f/GHz	τ_f /(×10^-6,℃^-1 )
0.3	0.54593	0.77355	0.54090	0.22842	55.2	35090	9.2
0.35	0.54624	0.77367	0.54211	0.22910	50.1	44910	-1.7
0.4	0.54647	0.77221	0.54901	0.23171	47.1	46290	-18.2

Fig. 2 Surface SEM images (a-c) and EDS patterns (d,e) of the SNCT-NTMx (0.3≤x≤0.4) specimens sintered at 1520℃ for 4 h

Fig. 3 Bulk density of the SNCT-NTMx (0.3≤x≤0.4) ceramics as a function of sintering temperature

Fig. 4 Dielectric constant (a) and Q×f (b) value of the SNCT-NTMx (0.3≤x≤0.4) ceramics as a function of sintering temperature

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Microstructure and Microwave Dielectric Property of (1-x)(Sr_0.2Nd_0.208Ca_0.488)TiO₃-xNd(Ti_0.5Mg_0.5)O₃ Ceramics with High Quality Factor

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