X射线荧光光谱在晶体材料组成分析中的应用

无机材料学报

X射线荧光光谱在晶体材料组成分析中的应用

卓尚军; 陶光仪; 吉昂; 盛成; 申如香

中国科学院上海硅酸盐研究所上海 200050

收稿日期:2001-12-30 修回日期:2002-02-26 出版日期:2003-01-20 网络出版日期:2003-01-20

Applications of X-ray Fluorescence Spectrometry in Elemental Analysis of Crystals

ZHUO Shang-Jun; TAG Guang-Yi; JI Ang; SHENG Cheng; SHEN Ru-Xiang

Shanghai Institute of Ceramics; Chinese Academy of Sciences; Shanghai 200050; China

Received:2001-12-30 Revised:2002-02-26 Published:2003-01-20 Online:2003-01-20

摘要/Abstract

摘要： 介绍了X射线荧光光谱在人工晶体材料组成分析中的应用.虽然x射线荧光光谱分析是一种非常有效的元素分析手段,但必须针对不同的样品和分析要求采用合适的样品制备方法,选择或配制合适的校正标样对基体效应进行校正.在样品为单晶时异常反射对光谱的定性解释和定量分析的条件选择可能产生影响,此时最好使用熔融制样法.使用测量结果时,应该充分考虑其不确定度.

关键词: X射线荧光光谱, 晶体, 定量分析, 测量不确定度

Abstract: The applications of X-ray fluorescence spectrometry in elemental analysis of crystals were
reviewed. Although it is an effective and efficient approach for elemental analysis, X-ray fluorescence analyses require different sample preparation
methods depending on different sample types and require calibration standards to correct matrix effects. Abnormal reflection may lead to
complicated background and confused qualitative interpretation or/and quantitative measuring conditions if the measured specimen is a single
crystal. In this case, the fusion method is preferable. Attention must be paid to the uncertainty of the measurement when the results are employed
to a specific purpose.

Key words: X-ray fluorescence spectrometry, crystal, quantitative analysis, uncertainty of mea- surement

中图分类号:

TB302

卓尚军,陶光仪,吉昂,盛成,申如香. X射线荧光光谱在晶体材料组成分析中的应用[J]. 无机材料学报.

ZHUO Shang-Jun,TAG Guang-Yi,JI Ang,SHENG Cheng,SHEN Ru-Xiang. Applications of X-ray Fluorescence Spectrometry in Elemental Analysis of Crystals[J]. Journal of Inorganic Materials.

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