[1] Alford N M, Penn S J. Sintered alumina with low dielectric loss. J. Appl. Phys., 1996, 80(10): 5895-5898.[2] Templeton A, Wang X, Penn S J, et al. Microwave dielectric loss of titanium oxide. J. Am. Ceram. Soc., 2000, 83(1): 95-100.[3] Ohishi Y, Miyauchi Y, Ohsato H, et al. Controlled temperature coefficient of resonant frequency of Al2O3-TiO2 ceramics by annealing treatment. Jpn. J. Appl. Phys., 2004, 43(6A): 749-751.[4] Miyauchi Y, Ohishi Y, Miyake S, et al. Improvement of the dielectric properties of rutile-doped Al2O3 ceramics by annealing treatment. J. Eur. Ceram. Soc., 2006, 26(10/11): 2093-2096.[5] Omatete O O, Janney M A, Strehlow R A. Gelcasting-a new ceramic forming process. Am. Ceram. Soc. Bull., 1991, 70(10): 1641-1649.[6] Franks G V, Velamakanni B V, Lange F F. Vibraforming and in situ flocculation of consolidated, coagulated, alumina slurried. J. Am. Ceram. Soc., 1995, 78(5): 1324-1328.[7] Xie Z P, Cheng Y B, Huang Y. Formation of silicon nitride bonded silicon carbide by aqueous gelcasting. Mater. Sci. Eng. A, 2003, 349(1/2): 20-28.[8] Wang L Y, Tang G Y, Xu Z K. Preparation and electrical properties of multilayer ZnO varistors with water-based tape casting. Ceram. Int., 2009, 35(1): 487-492.[9] Hakki B W, Coleman P D. A dielectric resonator method of measuring inductive capacities in the millimeter range. IRE Trans. MTT, 1960, 8(4): 402-410.[10] Zheng Y, Zhao X, Lei W, et al. Effects of Bi2O3 addition on the microstructures and microwave dielectric characteristics of Ba6-3x(Sm0.2Nd0.8)8+2xTi18O54(x=2/3) ceramics. Mater. Lett., 2006, 60(4): 459-463.[11] Huang C L, Hsu C S, Lin R J. Improved high-Q microwave dielectric resonator using ZnO and WO3-doped Zr0.8Sn0.2TiO4 ceramics. Mater. Res. Bull., 2001, 36(11): 1985-1993. |