Journal of Inorganic Materials ›› 2022, Vol. 37 ›› Issue (7): 795-801.DOI: 10.15541/jim20210658
Special Issue: 【信息功能】MAX层状材料、MXene及其他二维材料(202409); 【信息功能】神经形态材料与器件(202409)
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HE Huikai1(), YANG Rui2,3(), XIA Jian3,4, WANG Tingze3,4, DONG Dequan3,4, MIAO Xiangshui2,3
Received:
2021-10-25
Revised:
2021-12-14
Published:
2022-07-20
Online:
2022-01-06
Contact:
YANG Rui, professor. E-mail: yangrui@hust.edu.cnAbout author:
HE Huikai (1992-), PhD. E-mail: hehk@hust.edu.cn
Supported by:
CLC Number:
HE Huikai, YANG Rui, XIA Jian, WANG Tingze, DONG Dequan, MIAO Xiangshui. High-uniformity Memristor Arrays Based on Two-dimensional MoTe2 for Neuromorphic Computing[J]. Journal of Inorganic Materials, 2022, 37(7): 795-801.
Fig. 1 Characterization of MoTe2 film and electrical measurement of Au/Ti/MoTe2/Au/Ti device (a) Photo of the centimeter-scale MoTe2 film; (b) Raman spectrum of the MoTe2 film; (c) Optical image of the prepared memristive devices with the structure of Au/Ti/MoTe2/Au/Ti; (d) Optical image of a 3×3 memristor array
Fig. 2 Stable bipolar resistive switching behavior and retention characteristics of the MoTe2 device (a) 20 cycles of I-V curves with a compliance current of 3 mA; (b) Retention characteristics of the HRS and the LRS read at 0.1 V
Fig. 3 Fast switching and good endurance of the MoTe2 device (a) SET speed under the pulse with the amplitude 1.3 V; (b) RESET speed of the MoTe2 device under the pulse with the amplitude of -1.0 V; (c) Over 2000 switching cycles obtained by applying SET pulse of 1.7 V/700 ns and RESET pulse of -1.2 V/7 μs Colorful figures are available on website
Fig. S6 I-V curves of 24 Au/Ti/MoTe2/Au/Ti devices All devices show stable resistive switching with low cycle-to-cycle and device-to-device variability
Fig. S8 Estimation of the array size for the prepared CVD-MoTe2 device (a) Sneak current path at read in a square crossbar array where all bits except the selected one are at LRS, and the equivalent circuit can be represented by three resistors (region 1, region 2 and region 3); (b) Dependence of the read margin on the crossbar line number for both 1R and 1T1R schemes
Fig. 5 Stable resistive switching of the MoTe2 array device after electroforming process (a) Electroforming process of the MoTe2 array device; (b) 20 cycles I-V curves of the MoTe2 array device with a compliance current of 5 Ma
Fig. 6 Potentiation and depression processes of the present device Circles are experimental results, red lines are fitting results with a phenomenological model $G=a+c{{e}^{-\beta N}}$
Fig. 7 Recognition accuracy for small and large handwritten digit images with experimental devices and ideal numeric Colorful figures are available on website
Fig. 8 Mechanism analysis of the memristive behavior in the MoTe2 device (a) I-V characteristics at HRS under different temperatures, with current increasing as the temperature increases Fitted data using the Schottky emission model for HRS is shown in the inset; (b) I-V characteristics at LRS at different temperatures, with current decreasing as the temperature increase, indicating a metallic characteristic
Scheme | | | | N |
---|---|---|---|---|
1R | 150 | 1500 | 150 | 4 |
1S1R | 350 | 1700 | 1.25×105 | 870 |
Table 1 Key resistance values and the corresponding maximum number of word lines/bit lines (N) with read margin >10%
Scheme | | | | N |
---|---|---|---|---|
1R | 150 | 1500 | 150 | 4 |
1S1R | 350 | 1700 | 1.25×105 | 870 |
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