Journal of Inorganic Materials ›› 2016, Vol. 31 ›› Issue (9): 948-954.DOI: 10.15541/jim20160034

• Orginal Article • Previous Articles     Next Articles

Preparation and Luminescence Properties of Lu2SiO5: Ce3+ Thin Film

WU Shuang1, LIU Bo1, CHEN Shi-Wei1, ZHANG Juan-Nan1, LIU Xiao-Lin1, GU Mu1, HUANG Shi-Ming1, NI Chen1, XUE Chao-Fan2   

  1. (1. Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China; 2. Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201204, China)
  • Received:2016-01-25 Revised:2016-03-29 Published:2016-09-20 Online:2016-08-29
  • About author:WU Shuang. E-mail: ws19911202@163.com

Abstract:

Lu2SiO5: Ce3+ thin film is a promising material for X-ray detection due to its high light output, short decay time, high density, and high spatial resolution. In present work, Lu2SiO5: Ce3+ thin films were prepared by Sol-Gel method. The optimal experimental conditions were obtained concerning solid content, adhesive content, water content, and annealing progress. Under the conditions with air humidity of 85%, sol’s H2O-Si ratio of 6.6, appropriate amount of PEG400, optimized solid content, and sintering starting from 450℃, the thin films are prepared crack-free with high transparence and excellent luminescent properties. The thickness of its single layer is 167 nm. It is found that water content is the major factor that causes film foggy, and sintering progress affects the reaction of organics and crystallization. Furthermore, solid content and the adhesive content are the two factors controlling the film thickness. The present study may promote the application of Lu2SiO5: Ce3+ thin films in detection systems.

Key words: Lu2SiO5: Ce3+ thin film, H2O-Si ratio, sintering process, adhesive, solid content, luminescence properties

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