LuAG:Ce, Mg闪烁陶瓷的X射线平板探测器成像研究

doi:10.15541/jim20150046

无机材料学报 ›› 2015, Vol. 30 ›› Issue (8): 814-818.DOI: 10.15541/jim20150046 CSTR: 32189.14.10.15541/jim20150046

LuAG:Ce, Mg闪烁陶瓷的X射线平板探测器成像研究

胡辰^1,2, 刘书萍^1,2, 冯召东^2,3,4, 秦秀波^3,4, 石云¹, 潘裕柏¹

(1. 中国科学院上海硅酸盐研究所, 透明光功能先进无机材料重点实验室, 上海 200050; 2. 中国科学院大学, 北京 100049; 3. 中国科学院北京高能物理研究所, 技术应用研究中心, 北京 100049; 4. 北京市射线成像技术与装备工程技术研究中心, 北京100049)

收稿日期:2015-01-22 修回日期:2015-03-17 出版日期:2015-08-20 网络出版日期:2015-07-21
作者简介:胡辰(1990–), 男, 博士研究生. E-mail:huchen@student.sic.ac.cn
基金资助:
国家自然科学基金(11005139, U1332202);上海市科委项目(13JC1405800, 11JC1412400)National Science Foundation of China(11005139, U1332202);Research Program of Shanghai Sciences and Technology Commission Foundation(13JC1405800, 11JC1412400)

Flat Panel X-ray Imaging of LuAG:Ce,Mg Ceramic Scintillators

HU Chen^1,2, LIU Shu-Ping^1,2, FENG Zhao-Dong^2,3,4, QIN Xiu-Bo^3,4, SHI Yun¹, PAN Yu-Bai¹

(1. Key Laboratory of Transparent Opto-Functional Inorganic Materials, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China; 2. University of Chinese Academy of Sciences, Beijing 100049, China; 3. Division of Nuclear Technology and Applications, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China; 4.?Beijing Engineering Research Center of Radiographic Techniques and Equipment, Beijing 100049, China)

Received:2015-01-22 Revised:2015-03-17 Published:2015-08-20 Online:2015-07-21
About author:HU Chen. E-mail:huchen@student.sic.ac.cn

摘要/Abstract

摘要：

采用固相反应法结合真空烧结技术制备了具有高光学质量高闪烁效率的(Lu, Ce, Mg)₃Al₅O₁₂ (LuAG:0.3at% Ce, 0.2at% Mg)闪烁陶瓷。将20 mm×20 mm×0.05 mm的陶瓷薄片用含有石墨粉的硅胶粘接在尺寸为25 mm×25 mm×4 mm的石墨基底上, 再激光加工切割成50 μm×50 μm、间距10 μm的正方形阵列, 进行X射线平板探测器成像研究, 并分别采用铅线对卡法和刀口法对陶瓷闪烁探测器的成像质量进行表征。结果表明: 陶瓷闪烁体制备的平板探测器成像清晰锐利, 铅线对卡法测试激光切割样品10 lp/mm下MTF可达17.5%。刀口法测试激光切割样品MTF为10%时, 分辨率可达9 lp/mm。该闪烁陶瓷具有在平板探测器上应用的潜力。

关键词: LuAG:Ce, Mg, 闪烁陶瓷, 平板探测器, X射线成像

Abstract:

(Lu, Mg, Ce)₃Al₅O₁₂ (LuAG: Ce, Mg) transparent ceramic scintillators (LuAG: 0.3at% Ce, 0.2at% Mg) with high optical and scintillation efficiency were fabricated by solid-state reaction method combined with vacuum sintering. The ceramic scintillator with dimension of 20 mm×20 mm×0.05 mm was packed with graphite substrate of 25 mm×25 mm×4 mm by graphite powders contained silica gel. Laser cutting of cubic array with dimension of 50 μm×50 μm and distance of 10 μm was performed. Flat panel X-ray imaging based on as prepaired ceramics was demonstrated. The images were good quality with a high resolution. The quality of the photos were evaluated by line-pair pattern method and knife edge method, respectively. MTF value of 17.5% was at 10 lp/mm for the ceramic scintillators after laser cutting, while resolution of 9 lp/mm achieved at 10% MTF by knife edge measurement. Based on above data, LuAG:Ce,Mg ceramics are proved to be a promising scintillator in flat panel X-ray imaging.

Key words: LuAG:Ce, Mg, ceramic scintillators, flat panel detector, X-ray imaging

中图分类号:

TL812

胡辰, 刘书萍, 冯召东, 秦秀波, 石云, 潘裕柏. LuAG:Ce, Mg闪烁陶瓷的X射线平板探测器成像研究[J]. 无机材料学报, 2015, 30(8): 814-818.

HU Chen, LIU Shu-Ping, FENG Zhao-Dong, QIN Xiu-Bo, SHI Yun, PAN Yu-Bai. Flat Panel X-ray Imaging of LuAG:Ce,Mg Ceramic Scintillators[J]. Journal of Inorganic Materials, 2015, 30(8): 814-818.

图/表 8

图1 固相反应法制备LuAG:Ce,Mg陶瓷的透过率曲线及其实物照片(2 mm厚)

Fig. 1 Transmission and photograph of LuAG:Ce,Mg ceramics fabricated by solid-state reaction method (2 mm thick)

图2 LuAG:Ce,Mg陶瓷和BGO单晶的X射线激发发射强度

Fig. 2 Radioluminescence spectra of LuAG:Ce,Mg ceramics and BGO single crystal

图3 X射线平板探测器成像原理示意图

Fig. 3 Sketchof flat panel imaging

图4 激光切割后LuAG:Ce,Mg陶瓷阵列在光学显微镜下的阵列结构照片及陶瓷块体实物照片

Fig. 4 Photographs of laser cut ceramics samples taken by optical microscope and digital camera

图5 未经激光切割陶瓷样品(a)和激光切割后陶瓷样品(b)的铅线对卡片X射线成像照片

Fig. 5 X-ray imaging of standard line-pair pattern by ceramics samples (a) without and (b) with cutting

图6 铅线对卡法测试的未经激光切割的陶瓷样品和激光切割陶瓷样品的MTF值

Fig. 6 MTF value of ceramics samples with and without laser cutting by line-pair pattern method

图7 未激光切割陶瓷样品(a)和激光切割陶瓷样品(b)的刀口X射线成像照片

Fig. 7 X-ray imaging of knife edge by ceramic samples (a) without and (b) with cutting

图8 刀口法测试激光切割样品和未激光切割陶瓷样品的MTF曲线

Fig. 8 MTF curve of ceramics samples with and without laser cutting measured by knife edge method

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LuAG:Ce, Mg闪烁陶瓷的X射线平板探测器成像研究

Flat Panel X-ray Imaging of LuAG:Ce,Mg Ceramic Scintillators

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