无机材料学报 ›› 2014, Vol. 29 ›› Issue (11): 1145-1150.DOI: 10.15541/jim20140173 CSTR: 32189.14.10.15541/jim20140173
张 倩, 丁士华, 宋天秀, 彭小松, 刘 旭, 蒋旭峰
收稿日期:
2014-04-08
修回日期:
2014-05-15
出版日期:
2014-11-20
网络出版日期:
2014-10-24
作者简介:
张 倩(1988–), 女, 硕士研究生. E-mail: zhangqiangogogo@126.com
基金资助:
ZHANG Qian, DING Shi-Hua, SONG Tian-Xiu, PENG Xiao-Song, LIU Xu, JIANG Xu-Feng
Received:
2014-04-08
Revised:
2014-05-15
Published:
2014-11-20
Online:
2014-10-24
About author:
ZHANG Qian. E-mail: zhangqiangogogo@126.com
Supported by:
摘要:
采用传统的固相反应法制备致密的Bi1.4Sc0.1ZnNb1.5-xRuxO7陶瓷样品, 研究Sc3+, Ru4+共同替代对Bi2O3-ZnO-Nb2O5陶瓷的相结构、晶体化学特性和介电性能的影响。结果表明: 当掺杂量x≤0.055 mol时, 样品保持单一的立方焦绿石结构。当掺杂量x=0.055 mol时, X射线衍射峰强度变弱, 峰形变宽。随着掺杂量的增加(0≤x≤0.04 mol), 陶瓷样品的晶格常数a和A位离子与第7个氧O′平均键长R(A-O')逐渐减小, 结晶化学参数键价和AV(O')[A4]增大, AV(O)[A2B2]减小, 48f(O)偏移量ξ增加。室温下样品的介电常数随着掺杂量的增加而减小, 介电损耗逐渐增加, 介电松弛特征减弱。低温下样品呈现明显的弛豫现象, 峰值温度Tm随着掺杂量的增加向高温方向移动。利用修正的Curie-Weiss(C-W)公式对样品εr-T曲线进行最小二乘法拟合, 得出样品的弛豫度γ由R0样品的1.57减小到R40样品的1.33。
中图分类号:
张 倩, 丁士华, 宋天秀, 彭小松, 刘 旭, 蒋旭峰. Sc3+和Ru4+联合取代BZN基陶瓷结构与介电性能的研究[J]. 无机材料学报, 2014, 29(11): 1145-1150.
ZHANG Qian, DING Shi-Hua, SONG Tian-Xiu, PENG Xiao-Song, LIU Xu, JIANG Xu-Feng. Structure and Dielectric Properties of Sc3+- and Ru4+-doped BZN Based Ceramics[J]. Journal of Inorganic Materials, 2014, 29(11): 1145-1150.
Sample | a/nm | R(A-O')/nm | R(B-O)/nm |
---|---|---|---|
R0 | 1.0588 | 0.2292 | 0.19967 |
R25 | 1.0561 | 0.2287 | 0.19968 |
R40 | 1.0543 | 0.2283 | 0.19969 |
R55 | 1.0609 | 0.2297 | 0.19969 |
表 1 BSZNR陶瓷样品的晶格常数a、平均键长R(A-O')和理想键长R(B-O)
Table 1 Lattice constant a, average distance of A-O' and expected average B-O bond length for BSZNR samples
Sample | a/nm | R(A-O')/nm | R(B-O)/nm |
---|---|---|---|
R0 | 1.0588 | 0.2292 | 0.19967 |
R25 | 1.0561 | 0.2287 | 0.19968 |
R40 | 1.0543 | 0.2283 | 0.19969 |
R55 | 1.0609 | 0.2297 | 0.19969 |
AV(O')[A4] | [Bi4] | [Bi3Zn] | [Bi2Zn2] | [Sc3Zn] |
---|---|---|---|---|
R0 | 2.3154 | 1.9405 | 1.5656 | 1.1093 |
R25 | 2.3517 | 1.9709 | 1.5901 | 1.1267 |
R40 | 2.3773 | 1.9924 | 1.6074 | 1.1390 |
表 2 (Bi1.4Sc0.1Zn0.5)(Zn0.5Nb1.5-xRux)O7样品的键价和AV(O')s
Table 2 The AV(O')s for O' dependent upon local [A4] stoichiometry for (Bi1.4Sc0.1Zn0.5)(Zn0.5Nb1.5-xRux)O7 samples
AV(O')[A4] | [Bi4] | [Bi3Zn] | [Bi2Zn2] | [Sc3Zn] |
---|---|---|---|---|
R0 | 2.3154 | 1.9405 | 1.5656 | 1.1093 |
R25 | 2.3517 | 1.9709 | 1.5901 | 1.1267 |
R40 | 2.3773 | 1.9924 | 1.6074 | 1.1390 |
AV(O)[A2B2] | [Bi2Ru2] | [Bi2RuNb] | [BiZnRu2] | [BiZnRuNb] |
---|---|---|---|---|
R0 | 1.2944 | 1.4435 | 1.7449 | 1.6678 |
R25 | 1.2942 | 1.4432 | 1.7444 | 1.6673 |
R40 | 1.2941 | 1.4430 | 1.7444 | 1.6670 |
表 3 (Bi1.4Sc0.1Zn0.5)(Zn0.5Nb1.5-xRux)O7样品的键价和AV(O)s
Table 3 The AV(O)s for O dependent upon local [A2B2] stoichiometry for (Bi1.4Sc0.1Zn0.5)(Zn0.5Nb1.5-xRux)O7 samples
AV(O)[A2B2] | [Bi2Ru2] | [Bi2RuNb] | [BiZnRu2] | [BiZnRuNb] |
---|---|---|---|---|
R0 | 1.2944 | 1.4435 | 1.7449 | 1.6678 |
R25 | 1.2942 | 1.4432 | 1.7444 | 1.6673 |
R40 | 1.2941 | 1.4430 | 1.7444 | 1.6670 |
Sample | εm | Tm(1MHz)/℃ | ξ/nm | C/K | γ |
---|---|---|---|---|---|
R0 | 143.6470 | -108.1 | 0.03157 | 1.0628×107 | 1.57 |
R25 | 125.0102 | -92.6 | 0.03171 | 2.0416×107 | 1.40 |
R40 | 125.0039 | -91.3 | 0.03180 | 4.3057×107 | 1.33 |
表 4 1 MHz 频率下BSZNR样品的介电弛豫峰温度Tm, 最大介电常数εm, 48f(O)的偏移量ξ和C-W弛豫拟合参数
Table 4 Temperature of maximum dielectric constant Tm, maximum dielectric constant εm, oxygen parameter ξ at 48f site and parameter of C-W relaxation
Sample | εm | Tm(1MHz)/℃ | ξ/nm | C/K | γ |
---|---|---|---|---|---|
R0 | 143.6470 | -108.1 | 0.03157 | 1.0628×107 | 1.57 |
R25 | 125.0102 | -92.6 | 0.03171 | 2.0416×107 | 1.40 |
R40 | 125.0039 | -91.3 | 0.03180 | 4.3057×107 | 1.33 |
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