Characterization and Research of Hexagonal Closed Packing Structured ZnO Nano-powders by X-ray Diffraction Method

doi:10.3724/SP.J.1077.2008.00199

Journal of Inorganic Materials

• Research Paper • Previous Articles Next Articles

Characterization and Research of Hexagonal Closed Packing Structured ZnO
Nano-powders by X-ray Diffraction Method

CHENG Guo-Feng¹, YANG Chuan-Zheng², HUANG Yue-Hong¹

(1. Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China;2. Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China)

Received:2007-01-16 Revised:2007-04-27 Published:2008-01-20 Online:2008-01-20

Abstract

Abstract: The X-ray diffraction (XRD) tests showed that the diffraction lines of hk0, h-k=3n in the hexagonal closed packing structured (HCPS) ZnO appeared only crystallite broadening effect. The two-fold broadening effects of crystallite-fault could be observed in the diffraction lines of h-k=3n±1, yet the selective broadening was not obvious. In this study, the least square method for separating twofold broadening effect of crystallite-fault were proposed and used to characterize the average crystallite size and stacking faults probability of HCPS ZnO. The results show that the average crystallite size and stacking faults probability are related with the preparation methods and the stoichiometric ratio of ZnO.

Key words: ZnO, crystallite size, stacking fault probability, X-ray diffraction (XRD)

CLC Number:

O766

CHENG Guo-Feng,YANG Chuan-Zheng,HUANG Yue-Hong. Characterization and Research of Hexagonal Closed Packing Structured ZnO
Nano-powders by X-ray Diffraction Method[J]. Journal of Inorganic Materials, DOI: 10.3724/SP.J.1077.2008.00199.

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Characterization and Research of Hexagonal Closed Packing Structured ZnO
Nano-powders by X-ray Diffraction Method

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