无机材料学报

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氧分压对直流磁控溅射制备 ZnO:Ga透明导电薄膜特性的影响

马全宝, 叶志镇, 何海平, 朱丽萍, 张银珠, 赵炳辉
  

  1. (浙江大学 材料系硅材料国家重点实验室, 杭州 310027)
  • 收稿日期:2006-12-13 修回日期:2007-01-13 出版日期:2007-11-20 网络出版日期:2007-11-20

Effects of Oxygen Partial Pressure on the Properties of Transparent Conductive ZnO:Ga Films Prepared by DC Reactive Magnetron Sputtering

MA Quan-Bao, YE Zhi-Zhen, HE Hai-Ping, ZHU Li-Ping, ZHANG Yin-Zhu, ZHAO Bing-Hui   

  1. (State Key Laboratory of Silicon Materials, Department of materials, Zhejiang University, Hangzhou 310027, China)
  • Received:2006-12-13 Revised:2007-01-13 Published:2007-11-20 Online:2007-11-20

摘要:

通过直流反应磁控溅射法在玻璃衬底上制备了掺镓ZnO(ZnO:Ga)透明导电薄膜, 研究了氧分压对ZnO:Ga透明导电薄膜结构和电光学性能的影响. X射线衍射结果表明所制备的薄膜具有c轴择优取向的六角多晶结构. ZnO:Ga透明导电薄膜的晶粒尺寸强烈依赖于氧分压的大小, 随着氧分压的增大薄膜的晶粒尺寸先增大后减小, 在氧分压为0.30 Pa时沉积的ZnO:Ga薄膜半高宽最小, 晶粒尺寸最大. 薄膜的电阻率随着氧分压的增大先减小后增大, 沉积薄膜的最低电阻率可达3.50×10-4Ω·cm. 此外, 所有ZnO:Ga薄膜在可见光范围内的平均透射率均超过90%.


关键词: ZnO:Ga, 透明导电氧化物薄膜, 磁控溅射, 氧分压, 光电特性

Abstract: Ga-doped zinc oxide (ZnO:Ga) transparent conductive films were deposited on glass substrates by DC reactive magnetron sputtering. The influence of oxygen partial pressure on the structural, electrical and optical properties of ZnO:Ga films was investigated. The X-ray diffraction (XRD) studies show that the films are highly oriented with their crystallographic c-axis perpendicular to the substrate. The grain size of ZnO:Ga films is strongly dependent on the oxygen partial pressure. With the oxygen partial pressure increasing, the grain size of the films increases first, reaches a maximum at 0.30Pa and then decreases. As the oxygen partial pressure increases, the resistivity of ZnO:Ga films decreases gradually, reaches a minimum at 0.30Pa and then increases. The lowest resistivity of ZnO:Ga films obtained at the oxygen partial pressure of 0.30Pa is 3.50×10-4Ω·cm. The average transmittance of the ZnO:Ga thin films is over 90%.

Key words: ZnO:Ga, transparent conductive oxide film, magnetron sputtering, oxygen partial pressure, electrical and optical properties

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