Regression Analysis of the Relationship between Dielectric Properties and Processing Parameters of (Zr0.7Sn0.3)TiO4 Ceramics

Abstract

Abstract: Regression analysis was used to obtain the quantitative relationship between the dielectric properties
(ε and tanδ) and processing parameters of (Zr_0.7Sn_0.3)TiO₄ ceramics, which include doping rates of CuO, ZnO and glass (x₁, x₂
and x₃ wt%, respectively), the calcination and sintering (x₄×10³ and x₅×10³℃, respectively) temperatures: ε=10.9731-1.4559x₁+9.9154x₂+1.9776x₃-3.3160x²₂-0.2286x²₃-
200.1697x²₄-161.9102x²₅+375.1160x₄x₅; lg(tanδ)=-38.5876-0.6452x₂+0.1235x₃+31.2221x₄+30.3861x₅+0.1100x²₁+0.2077x²₂-0.0106x²₃-27.4317x₄x₅. It is possible to predict the dielectric properties under
given processing parameters, and to determine the processing parameters that satisfy certain dielectric properties. This helps to accelerate the
investigation of electric ceramic materials.

Key words: regression analysis, （Zr_0.7Sn_0.3）TiO₄, dielectric properties

CLC Number:

TQ174

WANG Guo-Qing,WU Shun-Hua,ZHAO Yu-Shuang,LIU Dan-Dan. Regression Analysis of the Relationship between Dielectric Properties and Processing Parameters of (Zr_0.7Sn_0.3)TiO₄ Ceramics[J]. Journal of Inorganic Materials.

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Regression Analysis of the Relationship between Dielectric Properties and Processing Parameters of (Zr_0.7Sn_0.3)TiO₄ Ceramics

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