Journal of Inorganic Materials

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Preparation and Electrical Properties of LiTa3O8 Thin Films

ZHANG De-Yin1,2, HUANG Da-Gui1, LI Jin-Hua3, LI Kun3   

  1. 1. School of Mechatronics Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China;2. Aviation Engineering Institute, Civil Aviation Flight University of China, Guanghan 618307, China; 3. Information Science Department, Jiangsu Polytechnic University, Changzhou 213016, China
  • Received:2008-01-03 Revised:2008-03-12 Published:2008-11-20 Online:2008-11-20

Abstract: A novel ferroelectric lithium tantalate LiTa3O8 thin film was prepared on Pt/Ti/SiO 2/Si substrate by sol-gel method using lithium ethoxide and tantalite ethoxide as starting materials. The structure of the LiTa3O8 film is similar to orthorhombic, which is different from LiTaO3 film based on XRD pattern. The SEM image reveals that the LiTa3O8 film crystallized at 750℃ is uniform, smooth and crack-free on the surface with thickness of 1μm. The electrical experiments show that the remanent polarization Pr and coercive field Ec of the LiTa3O8 film polarized at 450kV/cm are 9.3μC/cm2 and 126.8kV/cm, respectively; the leakage current of the LiTa3O8 film is 8.85×10-9A/cm2 at the electric field of 9.5kV/cm, lower than that of LiTaO3 film. The dielectric constant and dielectric loss of the LiTa3O8 film are 58.4 and 0.26, respectively, at frequency of 1kHz. And the crystallization temperature of sol-gel derived LiTa3O8 film is 50℃ higher than that of LiTaO3 film.

Key words: ferroelectric thin film, LiTa3O8, sol-gel, ferroelectric properties, dielectric properties

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