无机材料学报 ›› 2015, Vol. 30 ›› Issue (5): 474-478.DOI: 10.15541/jim20140519 CSTR: 32189.14.10.15541/jim20140519

• 研究论文 • 上一篇    下一篇

氢稀释比对氢化硅薄膜两相结构和电学性能的影响

鲁媛媛, 李贺军, 杨冠军   

  1. (西北工业大学 材料科学与工程学院, 西安710072)
  • 收稿日期:2014-10-11 修回日期:2014-12-02 出版日期:2015-05-20 网络出版日期:2015-04-28
  • 作者简介:鲁媛媛(1985–), 女, 博士研究生. E-mail: luyuanyuan85@163.com
  • 基金资助:

    国家自然科学基金(51221001)

Influence of Hydrogen Dilution on Two-phase Structure and Electrical Properties of Hydrogenated Silicon Thin Films

LU Yuan-Yuan, LI He-Jun, YANG Guan-Jun   

  1. (School of Materials Science and Engineering, Northwestern Polytechnical University, Xi’an 710072, China)
  • Received:2014-10-11 Revised:2014-12-02 Published:2015-05-20 Online:2015-04-28
  • About author:LU Yuan-Yuan. E-mail: luyuanyuan85@163.com
  • Supported by:

    National Natural Science Foundation of China (51221001)

摘要:

通过改变氢气对硅烷的稀释比R, 采用等离子体增强化学气相沉积(PECVD)方法制备出具有非晶/微晶相变过渡区的氢化硅薄膜, 并研究了所得硅膜在不同沉积阶段的微观结构和形貌、晶化效果和电学性能。研究结果表明, 当R=10时, 样品呈典型的非晶特性; 随着氢稀释比的增大, 薄膜表现出两相结构, 且衬底表面处的非晶过渡层逐渐减薄, 也即非晶向微晶的转变提前。但XRD结果显示, 硅膜的晶化率和平均晶粒尺寸随着R的增加呈先增后减的趋势, 在R=28.6时达到最大值。另外, 暗电导率和载流子浓度表现出了与晶化率一样的变化趋势, 显示出硅膜的电学性能与微观结构的高度正相关性。

关键词: 氢稀释比, 硅膜, 两相结构, 电学性能

Abstract:

Hydrogenated silicon thin films with two-phase structure were prepared by plasma enhanced chemical vapor deposition (PECVD) at different hydrogen dilution ratios (R) and their microstructure and electrical properties were investigated. The results indicated that the film was amorphous when R was 10. As R increased, the film presented two-phase structure, and the thickness of the amorphous layer tended to thin and the transition to crystalline from amorphous started earlier. From XRD results, both crystallinity and average grain size of the films increased firstly and then decreased with increase of R, and at maximum values when R was 28.6. The change rule of dark conductivity and carrier density agreed with the change rule of crystallinity and average grain size, which showed a close positive relationship between electrical properties and the microstructure.

Key words: hydrogen dilution, silicon thin film, two-phase structure, electrical property

中图分类号: