Scanning Probe Microscopy Study of the Domain Growth in Relaxor Ferroelectrics

Abstract

Abstract: The aim of this paper was to study the domain growth of typical relaxor ferroelectric ceramics 0.9Pb(Mg_1/3Nb_2/3)O₃-0.1PbTiO₃. The topographic and elecric force images of samples were observed by Scanning Probe Microscopy taping mode and lift mode respectively The results demonstrate that the nano scale polar regions can switch to sub-micro domains under different dc voltages on the tip. Such process is carried out by 180° domain switching of micro dipoles along < 111 > axis in crystal under extra field.

Key words: scanning probe microscoopy, domain, relaxou ferroelectrics

CLC Number:

TN304

LIU Xi,ZHOU He-Ping,ZHANG Xiao-Wen,HAN Li,CHEN Hao-Ming. Scanning Probe Microscopy Study of the Domain Growth in Relaxor Ferroelectrics[J]. Journal of Inorganic Materials.

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Scanning Probe Microscopy Study of the Domain Growth in Relaxor Ferroelectrics

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