Journal of Inorganic Materials

• Research Paper • Previous Articles     Next Articles

Silicon Carbon Nitride Films Grown by Hot-Filament Chemical Vapor Deposition

NIU Xiao-Bin1,2; LIAO Yuan1,2; CHANG Chao1,2; YU Qing-Xuan2; FANG Rong-Chuan2   

  1. 1.Structure Research Laboratory; University of Science and Technology of China; Hefei 230026; China; 2.Department of Physics; University of Science and Technology of China; Hefei 230026; China
  • Received:2003-03-25 Revised:2003-05-26 Published:2004-03-20 Online:2004-03-20

Abstract: The silicon carbon nitride (SiCN) films were successfully synthesized on silicon substrate using SiH4/CH4/
H2/N2 mixture by hot-filament chemical vapor deposition (HFCVD) without bias. The resultant films consist of many micro-rods with mean diameter about
3μm and lengths up to 35 μm measured by SEM, and the micro-rods are built with blocks of nanocrystalline SiCN grown in amorphous matrix observed
by HRTEM. Further SAED and XRD analysis indicate that the structure of SiCN nanocrystal is similar to that of α-Si3N4 with small deviations.
XPS and FTIR were employed to investigate the compositions of SiCN films, indicating the presence of Si, C, N, O and H, and a chemical bonding network
of C=N, N-Si and N-C bonds in SiCN films, but the C-Si bonds absent. From these results, we suggest that the SiCN growth may mainly include two
processes: the growth of α-Si3N4 clusters and the substitution of Si atoms by C atoms.

Key words: HFCVD, SiCN films, α-Si3N4

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