[1] Murray C B, Norris D J, Bawendi M G. J. Am. Chem. Soc., 1993, 115: 8706--8715. [2] Margaret A. Hines and Philippe Guyot-Sionnest, J. Phys. Chem., 1996, 100: 468--471. [3] Masanori Tanaka, Shinya Sawai, Masaya Sengoku, et al. J. Appl. Phys., 2000, 87: 8535--8540. [4] Chen Y Y, Duh J G, Chiou B S, et al. Thin Solid Films, 2001, 392: 50--55. [5] Bhargava R N. J. Lumin. 1996, 70: 85--94. [6] Bhargava R N, Gallagher D. J. Lumin. 1994, 60: 275--280. [7] Dimitrova V, Tate J. Thin Solid Films, 2000, 365: 134--138. [8] Wang Ming-wen, Sun Ling-dong, Fu Xue-feng, et al. Solid State Communications, 2000, 115: 493--496. [9] Shono Y, Oka T. Journal of Crystal Growth, 2000, 210: 278--282. [10] Kezuka T, Konishi M, Isobe T, et al. J. Lumin. 2000, 87--89: 418--420. [11] Bhargava R N, Gallagher D. Phys. Rev. Lett., 1994, 72: 416--419. [12] 孙聆东, 刘昌辉, 廖春生, 等. 发光学报, 1999, 20: 90--92. [13] IL Yu, Tetsuhiko isobe, mamoru senna. J. Phys. Chem. Solids. 1996, 57: 373--379. |