Journal of Inorganic Materials ›› 2017, Vol. 32 ›› Issue (3): 326-330.doi: 10.15541/jim20160332

• Orginal Article • Previous Articles     Next Articles

Growth, Magnetic and Electrical Transport Properties of La0.7Sr0.3MnO3 Thin Films on PLZST Ceramics

Ling XIAO1(), Ying CHEN1, Zhen LIU1, Gen-Shui WANG1, Zhi-Yu WEN2, Xian-Lin DONG1()   

  1. 1. CAS Key Lab of Inorganic Functional Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China
    2. Micro-system Center, Chongqing University, Chongqing 400030, China
  • Received:2016-05-24 Online:2017-03-20 Published:2017-02-24
  • About author:XIAO Lin(1990–), female, candidate of Master degree. E-mail: 13916314676@163.com
  • Supported by:
    National Natural Science Foundation of China (51302295, 61371059);Natural Science Foundation of Shanghai (13ZR1445600);Visiting Scholar Foundation of Key Discipline Laboratory of New Micro/Nano Device and System Technology in Chongqing University (2014MS05)

Abstract:

La0.7Sr0.3MnO3 (LSMO) thin films with different thicknesses were deposited on (Pb0.97La0.02) (Zr0.58Sn0.3025Ti0.1175)O3 (PLZST) ceramics by RF magnetron sputtering, and their microstructure, magnetic and electrical transport properties were investigated. Microscopy observations show that LSMO thin films are perovskite structure without obvious impurity phase. All the LSMO thin films display smooth surface with uniform, and roughness is as low as 2.93 nm for LSMO thin films at the thickness of 20 nm. Furthermore, large magnetoresistance (MR) effect was observed in LSMO thin films in a broad temperature range of 10-300 K. Particularly the MR of LSMO thin films with 20 nm in thickness exhibits excellent temperature stability. Moreover, the Curie temperature, metal-insulator transition temperature, saturation magnetization and electrical conductivity decrease as the film thickness increases, which is attributed to the diffusion of Pb, Sn, Zr, etc. in the samples, resulting in the distortion of MnO6 octahedron.

Key words: La0.7Sr0.3MnO3 thin films, PLZST ceramics, magnetoresistance, diffusion

CLC Number: 

  • TQ174