Abstract: Lead iodide (PbI₂) polycrystalline thin films were deposited on glass substrates by vacuum evaporation technique. The structure, surface morphology and composition of the films were characterized by using X-ray diffraction, scanning electron microscope, X-ray photoelectron spectrometer. The results indicate that the films are polycrystalline with a preferred orientation along (001). The measurement of conductivity as a function of temperature shows that the dark conductivity of the film at room temperature is as low as 3.09×10^-11(Ω·cm)^-1, and the activation energy is 0.78eV.

Key words: polycrystalline PbI₂ thin film, vacuum evaporation, radiation detect