1 Garvie R, Nicholson P. J. Am. Ceram. Soc., 1972, 55: 303. 2 Toraya H, et al. J. Am. Ceram. Soc., 1984, 67: c119. 3 Toraya H, et al. J. Am. Ceram. Soc., 1984, 67: c183. 4 Schmid H K. J. Am. Ceram. Soc., 1987, 70: 367. 5 Cawley J D, Lee W E. In: Materials Science and Technology, A Comprehensive Treatment, Vol. 11, Structure and Properties of Ceramics, Swain M V ed. Weinheim, New York, Basel Cambridge, Tokyo, VCH, 1994. 103. 6 Hill R J, Howard C J. J. Applied Cryst., 1987, 20: 467. 7 Rietveld H M. J. Applied Cryst., 1969, 2: 65. 8 王佩玲, 戴健. 无机材料学报, 1997, 12 (1): 86. 9 王佩玲, 戴健. 无机材料学报, 1997, 12 (1): 93. 10 Johansson K E, Palm T, Werner P -E. J. Phys. E, 1980, 13: 1289. 11 Wiles D B, et al. In: User’s guide to program DBW32s for Rietveld analysis of X-ray and neutron powder diffraction pattern (Version 8804), School of Physics, Institute of Technology, Atlanta, USA, 1988. 12 Howard C J, et al. Acta Cryst., 1988, B 44: 116. |