Correlation between Stacking Faults in Epitaxial Layers of 4H-SiC and Defects in 4H-SiC Substrate
GUO Yu, PENG Tong-Hua, LIU Chun-Jun, YANG Zhan-Wei, CAI Zhen-Li
Journal of Inorganic Materials . 2019, (7): 748 -754 .  DOI: 10.15541/jim20180443