Defects and Microstructures in the Surface Layer of Single-crystal Silicon Induced by High-current Pulsed Electron Beam
WANG Xue-Tao, GUAN Qing-Feng, GU Qian-Qian, PENG Dong-Jin, LI Yan1, CHEN Bo
Journal of Inorganic Materials . 2010, (12): 1313 -1317 .  DOI: 10.3724/SP.J.1077.2010.01313