agnetroresistance and currentvoltage characteristics of the composite (La2/3Sr1/3MnO3)x/(ZnO)1-x films prepared by the pulsed laser deposition method on Si(100) substrates oxidized by SiO2 were investigated. XRD patterns indicate that ZnO and LSMO have (002) and (101) dominant orientations, respectively, and they form the coexisting system of two phases. Experimental results show the film with x=0.3 favors a semiconductive conduction and the film with x=0.4 exhibits the typical insulatormetal (I-M) transition. The films have the low field magnetoresistance(LFMR) effect and the nonlinear currentvoltage characteristics. The maximum LFMR value of the film with x=0.3 is about 28.8% at T=60K under an applied magnetic field of about 0.7T. The currentvoltage fitting shows that a great number of interface states appear at the depletion between La2/3Sr1/3MnO3 and ZnO grains due to the mismatch of the lattice.
JIN Ke-Xin
,
ZHAO Sheng-Gui
,
TAN Xing-Yi
,
CHEN Chang-Le
. Magnetroresistance and Currentvoltage Characteristics in La2/3Sr1/3MnO3/ZnO Composite Films[J]. Journal of Inorganic Materials, 2009
, 24(3)
: 591
-594
.
DOI: 10.3724/sp.j.1077.2009.00591
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