Research Paper

Sintering Behavior, Microstructure and Transport Properties of Bi2V0.9Cu0.1-x SnxO 5.5-δ Oxygen-ion Conductor

  • WU Xiu-Sheng ,
  • FANG Shu-Min ,
  • JIANG Guo-Shun ,
  • CHEN Chu-Sheng ,
  • LIU Wei
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  • Laboratory of Advanced Functional Materials and Devices,
    Department of Materials Science and Engineering, University of Science and
    Technology of China, Hefei 230026, China

Received date: 2005-12-26

  Revised date: 2006-03-31

  Online published: 2006-11-20

Abstract

The samples of Bi 2 V 0.9 Cu 0.1-x Sn x O 5.5-δ (0≤ x ≤0.75) were prepared by solid-state reaction. Room temperature powder X-ray diffraction (XRD) indicates that the synthesized compounds present the tetragonal γ-phase structure. The measurement results show that doped-Sn benefits to the control of microstructure of the sample and favor its mechanic property though it doesn’t further improve the electrical conductivity of the system. The oxygen permeation measurement result indicates oxygen transport in Bi 2 V 0.9 Cu 0.1-x Sn x O 5.5-δ system is controlled mainly by the process of surface oxygen exchange.

Cite this article

WU Xiu-Sheng , FANG Shu-Min , JIANG Guo-Shun , CHEN Chu-Sheng , LIU Wei . Sintering Behavior, Microstructure and Transport Properties of Bi2V0.9Cu0.1-x SnxO 5.5-δ Oxygen-ion Conductor[J]. Journal of Inorganic Materials, 2006 , 21(6) : 1423 -1428 . DOI: 10.3724/SP.J.1077.2006.01423

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