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Journal of Inorganic Materials

Journal of Inorganic Materials >

2009 , Vol. 24 >Issue 2: 234 - 238

DOI: https://doi.org/10.3724/SP.J.1077.2009.00234

Research Paper

Analysis to Microstructure and PhotoLuminescent Properties of CuO/SiO2 Composite Thin Films

  • SHI Feng ,
  • LI Yu-Guo ,
  • SUN Qin-Jun
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  • College of Physics and Electronic, Shandong Normal University, Jinan 250014, China

Received date: 2008-06-24

  Revised date: 2008-09-25

  Online published: 2009-03-20

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Abstract

Cu/SiO2 composite thin films were deposited on n-type Si(111) substrates by radio frequency (RF) magnetron cosputtering method, annealed at high temperature in N2 atmosphere, then cooling and oxidation in the air to fabricate low-dimensionality CuO nanostructure. The microstructure and photo luminescent properties were studied. The main phase of sample is cubic CuO(200) crystal face and sample forms nanoline structure with Cu, O elements as the main components to form CuO/SiO2 composite thin film in the sample surface after annealing at 1100℃. The ultraviolet light and purplelight appear in photoluminescence (PL) spectra, which is abscribed to the electron transition from the defect level，resulting from the Cu vacancies to the conductor band of CuO composite thin films.

Key words： radio frequency magnetron cosputtering; cupric oxide/sillica composite thin films; microstructure; photoluminescent properties

Cite this article

SHI Feng , LI Yu-Guo , SUN Qin-Jun . Analysis to Microstructure and PhotoLuminescent Properties of CuO/SiO2 Composite Thin Films[J]. Journal of Inorganic Materials, 2009 , 24(2) : 234 -238 . DOI: 10.3724/SP.J.1077.2009.00234

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