Research Paper

Study on Micro-structural Properties of PbTe/Cd 0.98 Zn 0.02 Te (111)Hetero-system Grown by Molecular-beam Epitaxy

  • SI Jian-Xiao ,
  • WU Hui-Zhen ,
  • XU Tian-Ning ,
  • XIA Ming-Long ,
  • WANG Qing-Lei ,
  • LU Ye-Qing ,
  • FANG Wei-Zheng ,
  • DAI Ning
Expand
  • 1. Department of Physics, Zhejiang University, Hangzhou 310027, China;

    2. Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China

Received date: 2007-06-19

  Revised date: 2007-08-29

  Online published: 2008-05-20

Abstract

The surface structure of PbTe epitaxial layers on Cd 0.98 Zn 0.02 Te (111) grown by molecular beam epitaxy was studied by atomic force microscope. It is shown that the surface is dominated by terraces with triangular shape and anomalous spiral steps. In order to clarify the origin of the triangular shape and spiral steps, PbTe/Cd 0.98 Zn 0.02 Te heteroepitaxial layers were investigated by using a high-resolution transmission electron microscope (HRTEM). As a result, it is confirmed that the triangular shape and spiral steps originate from the intrinsic Frank dislocations represented in PbTe/Cd 0.98 Zn 0.02 Te interface. Considering the effect of the kinetics of dislocations, it is
revealed that the strain field arising from dislocations affects the formation of spiral steps. The experiments data are in agreement with the calculations based on elasticity theory and dislocation gliding theory.

Cite this article

SI Jian-Xiao , WU Hui-Zhen , XU Tian-Ning , XIA Ming-Long , WANG Qing-Lei , LU Ye-Qing , FANG Wei-Zheng , DAI Ning . Study on Micro-structural Properties of PbTe/Cd 0.98 Zn 0.02 Te (111)Hetero-system Grown by Molecular-beam Epitaxy
[J]. Journal of Inorganic Materials, 2008
, 23(3) : 545 -548 . DOI: 10.3724/SP.J.1077.2008.00545

References

[1] Kazuto Koike, Takayoshi Honden, Isao Makabe, et al. Journal of Crystal Growth, 2003, 257 (2): 212--217.
[2] 曹春芳, 吴惠桢, 斯剑霄, 等. 物理学报, 2006, 55 (4): 2021--2025.
[3] Springholz G, Ueta A Y, Frank N, et al. Appl. Phys. Lett., 1998, 69 (19): 2822--2824.
[4] Zogg H, Maissen C, Blunier S, et al. Semicond. Sci. Technol., 1993, 8 (3): S337--S341.
[5] Heiss W, Grosiss H, Kaufmann E, et al. Appl. Phys. Lett., 2006, 88 (19): 192109--192111.
[6] Springholz G, Frank N,Bauer G. Thin solid films, 1995, 267 (1): 15--23.
[7] Blunier S, Zogg H, Maissen C, et al. Phys. Rev. Lett., 1992, 68 (24): 3599--3602.
[8] Hannon J B, Shenoy V B, Schwarz K W. Science, 2006, 313 (5791): 1266--1629.
[9] 杨顺华. 晶体位错理论基础(第一卷). 北京: 科学出版社, 1998. 68, 394.
[10] Springholz G. Appl. Sur. Sci., 1997, 112 (1): 12--22.
Outlines

/