Research Paper

Characterization and Research of Hexagonal Closed Packing Structured ZnO
Nano-powders by X-ray Diffraction Method

  • CHENG Guo-Feng ,
  • YANG Chuan-Zheng ,
  • HUANG Yue-Hong
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  • (1. Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China;2. Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China)

Received date: 2007-01-16

  Revised date: 2007-04-27

  Online published: 2008-01-20

Abstract

The X-ray diffraction (XRD) tests showed that the diffraction lines of hk0, h-k=3n in the hexagonal closed packing structured (HCPS) ZnO appeared only crystallite broadening effect. The two-fold broadening effects of crystallite-fault could be observed in the diffraction lines of h-k=3n±1, yet the selective broadening was not obvious. In this study, the least square method for separating twofold broadening effect of crystallite-fault were proposed and used to characterize the average crystallite size and stacking faults probability of HCPS ZnO. The results show that the average crystallite size and stacking faults probability are related with the preparation methods and the stoichiometric ratio of ZnO.

Cite this article

CHENG Guo-Feng , YANG Chuan-Zheng , HUANG Yue-Hong . Characterization and Research of Hexagonal Closed Packing Structured ZnO
Nano-powders by X-ray Diffraction Method[J]. Journal of Inorganic Materials, 2008
, 23(1) : 199 -202 . DOI: 10.3724/SP.J.1077.2008.00199

References

[1] XRD Pattern Processing. Materials Data Inc. , 2005, Jade 6.0
[2] Langford JI,Bouitif A, et al, J. Appl. Cryst., 1993, 26 (1): 22--32.
[3] 钦佩, 娄豫皖, 杨传铮, 等. 物理学报, 2006, 55 (3): 1325--1335.
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