[1] Uchino K. Ferroelectric Devices, London and New York: Marcel Dekker Inc, 2000. [2] Jaffe B, Cook W R, Jaffe H. Piezoelectric Ceramics, New York: Academic Press, 1971. [3] Park S E, Shrout T R. J. Appl. Phys., 1997, 82 (4): 1804--1811.
[4] Service R E. Science, 1997, 275 (3): 1878--1878.
[5] 张孝文, 陈克丕(ZHANG Xiao-Wen, et al). 无机材料学报(Journal of Inorganic Materials), 2002, 17 (3): 385--391.
[6] 孙士文, 潘晓明, 李东林, 等(SUN Shi-Wen, et al). 无机材料学报(Journal of Inorganic Materials), 2004, 19 (3): 541--545.
[7] 王评初, 孙士文, 潘晓明, 等(WANG Ping-Chu, et al) 无机材料学报(Journal of Inorganic Materials), 2004, 19 (5): 1195--1198.
[8] Messing G L, Trolier-Mckinstry S, Sabolsky E M, et al. Critical Reviews in Solid State and Materials Science, 2004, 29 (2): 45--96.
[9] Kimura T. J. Ceram. Soc. Jpn., 2006, 114 (1): 15--25.
[10] Neurgaonkar R R, Oliver J R, Cory W K, et al. Ferroelectrics, 1994, 160 (2): 265--267.
[11] Zhao L L, Gao F, Zhang C S, et al. Journal of Crystal Growth, 2005, 276 (3-4): 446--452.
[12] Saito Y, Hisaaki T, Tani T, et al. Nature, 2004, 432 (11): 84--87.
[13] Tani T, Kimura T. Advances in Applied Ceramics, 2006, 105 (1): 55--63. [14] Lotgering F K. J. Inorg. Nucl. Chem., 1959, 9 (1): 113--115.
[15] 张孝文. 硅酸盐学报, 1983, 11 (2): 141--148.
[16] Sun S W, Pan X M, Wang P C. Appl. Phys. Lett., 2004, 84 (4): 574--576.
[17] Sabolsky E M, James A R, Kwon S, et al. Appl. Phys. Lett., 2001, 78 (17): 2551--2553.
[18] Kelly J, Leonard M, Tantigate C, et al. J. Am. Ceram. Soc., 1997, 80 (4): 957--959.
[19] Viehland D, Li J F, Amin A. J. Appl. Phys., 2002, 92 (12): 3985.
[20] 李永祥, 杨群保, 曾江涛, 等. 四川大学学报, 2005, 48 (2): 230--235.
[21] 曾江涛, 李永祥, 杨群保, 等. 电子材料与元件, 2004, 23 (11): 66--70.
[22] Jing X Z, Li Y X, Yang Q B, et al. Ceramics International, 2004, 30 (7): 1889--1893.
[23] Jing X Z, Li Y X, Yang Q B, et al. Journal of the European Ceramic Society, 2005, 25 (12): 2727--2730.
[24] Sabolsky E M, Trolier-Mckinstry S, Messing G L, et al. J. Appl. Phys., 2003, 93 (7): 4072--4080.
[25] Yilmaz H, Messing G L, Trolier-McKinstry S. Journal of Electroceramics, 2003, 11 (3): 207--215.
[26] Yilmaz H, Trolier-McKinstry S, Messing G L. Journal of Electroceramics, 2003, 11 (3): 217--226.
[27] Suvaci E, Oh K S, Messing G L, et al. Acta Materialia, 2001, 49 (11): 2075--2081.
[28] Suvaci E, Messing G L. J. Am. Ceram. Soc., 2000, 83 (8): 2041--2048.
[29] Seabaugh M M, Messing G L, Vaudin M D. J. Am. Ceram. Soc., 2000, 83 (12): 3109--3116.
[30] Kimura T, Sakuma Y, Murata M. Journal of the European Ceramic Society, 2005, 25 (12): 2227--2230.
[31] Kimura T, Miura Y, Fuse K. Int. J. Appl. Ceram. Technol., 2005, 2 (1): 15--23.
[32] Sugawara T, Nomura Y, Kimura T, et al. J. Ceram. Soc. Jpn., 2001, 109 (10): 897--900.
[33] Muramatsu H, Kimura T. Journal of Electroceramics, 2004, 13 (1-3): 531--535.
[34] Tani T. J. Korean Phys. Soc., 1998, 32 (S2): 1217--1220.
[35] Seno Y, Tani T. Ferroelectrics, 1999, 224 (1-4): 793--800.
[36] Tani T. J. Ceram. Soc. Jpn., 2006, 114 (5): 363--370.
[37] Takeuchi T, Tani T, Saito Y. Jpn. J. Appl. Phys., 1999, 38 (9B): 5553--5556.
[38] Tani T, Itahara H, Xia C T, et al. Journal of Materials Chemistry, 2003, 13 (8): 1865--1867.
[39] Kimura T, Takahashi T, Tani T, et al. J. Am. Ceram. Soc., 2004, 87 (8): 1424--1429.
[40] Cross E. Nature, 2004, 432 (11): 24--25.