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2009 , Vol. 24 >Issue 2: 221 - 224

DOI: https://doi.org/10.3724/SP.J.1077.2009.00221

研究论文

二氧化钛薄膜的三阶非线性光学特性

  • 龙 华 ,
  • 陈爱平 ,
  • 杨 光 ,
  • 李玉华 ,
  • 陆培祥
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  • 华中科技大学 武汉光电国家实验室， 武汉 430074

收稿日期: 2008-06-16

  修回日期: 2008-08-03

  网络出版日期: 2009-03-20

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Thirdorder Nonlinear Optical Properties of TiO2 Films

  • LONG Hua ,
  • CHEN Ai-Ping ,
  • YANG Guang ,
  • LI Yu-Hua ,
  • LU Pei-Xiang
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  • Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074, China

Received date: 2008-06-16

  Revised date: 2008-08-03

  Online published: 2009-03-20

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摘要

采用脉冲激光沉积技术在熔石英基片上制备了c轴取向的锐钛矿相TiO2薄膜.通过X射线衍射和原子力显微镜对薄膜的结构、结晶性和表面特性进行了表征.通过透射光谱计算得到TiO2薄膜折射率约为2.1，光学带隙约为3.18eV.结合飞秒激光和Z扫描方法测量了薄膜的超快非线性光学特性，结果表明：锐钛矿TiO2薄膜具有负的非线性吸收系数和负的非线性折射率，其大小分别为-6.2×10-11m/W和-6.32×10-17m2/W，对应的三阶非线性极化率的实部和虚部分别为-7.1×10-11esu和-4.42×10-12esu.并计算薄膜的优值比T=βλ/n2≈0.8，表明锐钛矿相的TiO2在非线性光学器件方面具有潜在的应用前景.

关键词： 二氧化钛; 薄膜; Z扫描; 三阶光学非线性

本文引用格式

龙 华 , 陈爱平 , 杨 光 , 李玉华 , 陆培祥 . 二氧化钛薄膜的三阶非线性光学特性[J]. 无机材料学报, 2009 , 24(2) : 221 -224 . DOI: 10.3724/SP.J.1077.2009.00221

Abstract

Anatase TiO2 films were fabricated on fused quartz by pulsed laser deposition （PLD） technique and the single-phase anatase films were obtained under the optimal conditions. The X-ray diffraction and atomic force microscope were used to investigate the structure and surface characters of the film. The third-order optical nonlinearities of the films were measured by Z-scan technique using a femtosecond laser (50fs) of 800nm. From the transmission spectra, the optical bandgap and linear refractive index of the TiO2 film are determined to be 3.18eV and 2.1, respectively. The nonlinear absorption coefficient and nonlinear refractive index are determined to be -6.2×10-11m/W and -6.32×10-17m2/W, respectively.The real and imaginary parts of third-order nonlinear susceptibility χ(3) are determined to be -7.1×10-11esu and -4.42×10-12esu, respectively. And the following figure of merit T=βλ/n2 is calculated to be 0.8 for the film, indicating that the anatase TiO2 films have great potential applications to nonlinear optical devices.

Key words： TiO2; films; Z-scan; third-order optical nonlinearities

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