无机材料学报

• 研究论文 •    下一篇

铁电材料的纳米尺度压电响应力显微术研究进展

余寒峰; 曾华荣; 初瑞清; 李国荣; 殷庆瑞   

  1. 中国科学院上海硅酸盐研究所高性能陶瓷与超微结构国家重点实验室, 上海 200050
  • 收稿日期:2004-03-01 修回日期:2004-04-07 出版日期:2005-03-20 网络出版日期:2005-03-20

Progress in Nanoscale Piezoresponse Force Microscopy on Ferroelectrics

YU Han-Feng; ZENG Hua-Rong; CHU Rui-Qing; LI Guo-Rong; YIN Qing-Rui   

  1. State Key Lab of High Performance Ceramics and Superfine Microstructure; Shanghai Institute of Ceramics; Chinese Academy of Sciences; Shanghai 200050; China
  • Received:2004-03-01 Revised:2004-04-07 Published:2005-03-20 Online:2005-03-20

摘要: 压电响应力显微术是在原子力显微镜的基础上,利用材料自身逆压电效应来探测样 品表面形变的一类技术总称.现已作为铁电材料研究的重要手段,应用于纳米尺度畴结构的三 维成像、畴结构的动态研究、畴结构控制和微区压电、铁电、漏电等物理性能表征等领域.本 文就近年来利用压电响应力显微术对铁电材料的研究方面作一综述.

关键词: 压电响应力显微术, 纳米尺度, 铁电畴, 微区性能

Abstract: Piezoresponse force microscopy, developed on the base of atomic force microscopy, is a technology of detecting the deflection of the sample surface under alternating electric field according to the converse piezoelectric effect. It has been used to research on nanoscale three-dimensional image of ferroelectric domains, dynamical behavior of domains, control of domain and characterization of local physical properties. This review is involved with the latest progress in piezoresponse force microscopy on ferroelectric materials.

Key words: piezoresponse force microscopy, nanoscale, ferroelectric domain, local property

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