纳米尺度铁电畴的扫描力显微镜成像研究进展

无机材料学报

纳米尺度铁电畴的扫描力显微镜成像研究进展

曾华荣; 方健文; 惠森兴; 李国荣; 殷庆瑞

中国科学院上海硅酸盐研究所高性能陶瓷与超微结构国家重点实验室上海 200050

收稿日期:2001-10-09 修回日期:2001-11-15 出版日期:2002-11-20 网络出版日期:2002-11-20

Progress in the Imaging of Nanoscale Ferroelectric Domain via Scanning Force Microscope

ZENG Hua-Rong; FANG Jian-Wen; HUI Sen-Xing; LI Guo-Rong; YIN Qing-Rui

State Key Lab of High Performance Ceramics and Superfine Microstructure; Shanghai Institute of Ceramics; Chinese Academy of Sciences; Shanghai 200050; China

Received:2001-10-09 Revised:2001-11-15 Published:2002-11-20 Online:2002-11-20

摘要/Abstract

摘要： 扫描力显微镜(SFM)作为一种新型的超分辨率近场扫描探针显微仪器正日益受到各学科领域的高度重视.在铁电材料领域,SFM是开展纳米尺度铁电畴结构成像、纳米尺度畴结构控制及纳米尺度微区的铁电性、介电性、压电性等特性研究的潜在的强有力的研究工具.本文就纳米尺度铁电畴的扫描力显微镜的成像原理的研究进展作一综述.

关键词: 纳米尺度, 铁电畴, 扫描力显微镜

Abstract: Scanning force microscope (SFM) is paid great attention as a super-resolutional near-field scanning probe microscope in all circles. SFM is becoming a powerful
technique with great potential for imaging and control of nanoscale domain structures in ferroelectric materials, and it is a promising technique well
suited for nanoscale investigation of local properties including ferroelectricity, piezoelectricity, dielectricity in ferroelectics. This review is involved with the
latest progress in the imaging principle of nanoscale ferroelectric domain via SFM.

Key words: nanoscale, ferroelectric domain, scanning force microscope

中图分类号:

TB34

曾华荣,方健文,惠森兴,李国荣,殷庆瑞. 纳米尺度铁电畴的扫描力显微镜成像研究进展[J]. 无机材料学报.

ZENG Hua-Rong,FANG Jian-Wen,HUI Sen-Xing,LI Guo-Rong,YIN Qing-Rui. Progress in the Imaging of Nanoscale Ferroelectric Domain via Scanning Force Microscope[J]. Journal of Inorganic Materials.

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