无机材料学报 ›› 2018, Vol. 33 ›› Issue (7): 761-766.DOI: 10.15541/jim20170486 CSTR: 32189.14.10.15541/jim20170486

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(Bi0.85Sb0.15)1-xAsx的电输运和红外光学特性研究

蔡丽君1, 史烜岱1, 吴济穷1, 朱圣云1, 黄耀1, 侯延辉1,2, 马永昌1,3   

  1. 1. 天津理工大学 材料科学与工程学院, 天津300384;
    2. 天津市光电显示材料与器件重点实验室, 天津 300384;
    3. 显示材料与光电器件省部共建教育部重点实验室, 天津 300384
  • 收稿日期:2017-10-17 修回日期:2018-01-02 出版日期:2018-07-10 网络出版日期:2018-06-19
  • 作者简介:蔡丽君(1992-), 男, 学士. E-mail: 18722155015@163.com
  • 基金资助:
    国家自然科学基金(10704054);天津理工大学国家级大学生创新创业训练计划(201610060030);National Natural Science Foundation of China (10704054);State Training Program of Innovation and Entrepreneurship of Tianjin University of Technology (201610060030)

Electric Transport and Infrared Property of (Bi0.85Sb0.15)1-xAsx

CAI Li-Jun1, SHI Xuan-Dai1, WU Ji-Qiong1, ZHU Sheng-Yun1, HUANG Yao1, HOU Yan-Hui1,2, MA Yong-Chang1,3   

  1. 1. School of Materials Science and Engineering, Tianjin University of Technology, Tianjin 300384, China;
    2. Tianjin Key Lab for Photoelectric Materials and Devices, Tianjin 300384, China;
    3. Key Laboratory of Display Materials and Photoelectric Devices (Tianjin University of Technology), Ministry of Education, Tianjin 300384, China
  • Received:2017-10-17 Revised:2018-01-02 Published:2018-07-10 Online:2018-06-19
  • About author:CAI Li-Jun. E-mail: 18722155015@163.com

摘要:

采用熔融法制备了(Bi0.85Sb0.15)1-xAsx合金, 用X射线衍射和电子能谱仪进行物相和组份表征, 随As掺杂量的增加, 晶胞体积收缩,名义掺杂浓度低于8%的样品没有出现杂相。在温度T =100 K以下, 母体Bi0.85Sb0.15的直流电阻温度关系呈现半导体特性, 而(Bi0.85Sb0.15)0.95As0.05在12~300 K范围都显示金属性。从红外反射光谱可知, Bi0.85Sb0.15的等离子边在远红外区且随温度下降向低频移动, 是窄带隙半导体的热激发行为。室温下(Bi0.85Sb0.15)0.95As0.05的自由电子等离子频率相比母体移动并不明显, 但是散射率增大, 在中红外600~2000 cm-1区间光电导谱比Bi0.85Sb0.15高, 经分析可知是源于带尾态的出现。综合对电输运和红外光谱的分析可知, (Bi0.85Sb0.15)0.95As0.05的费米能级应处于扩展态区, 而并非定域态。

 

关键词: 红外光谱, Bi-Sb合金, As掺杂

Abstract:

(Bi85Sb15)100-xAsx alloys were grown by melting stoichiometric mixture of elements Bi, Sb, and As. The phases and components of samples were analyzed by X-ray diffraction and the energy dispersion analysis. The As-doped (less than 8% in nominal) alloys have no impurity phases. Below T =100 K, Bi0.85Sb0.15 reveals semiconductor behavior in temperature dependent dc-resistivity, whereas (Bi0.85Sb0.15)0.95As0.05 shows a metallic characteristic in the measured temperature range. The plasma of Bi0.85Sb0.15 shift towards low energy in far infrared reflectance spectra with the decrease of temperature, indicating thermally excited response of free electrons. Comparing with undoped Bi0.85Sb0.15, the plasma frequency of 5% As doped compound changes slightly, whereas the scattering rate of the free carriers increases. The infrared conductivity spectrum is enhanced in the range 600 cm-1-2000 cm-1, due to the formation of tails of the energy bands. Combining with the dc electric transport and the analysis of infrared properties, the Fermi level of (Bi0.85Sb0.15)0.95As0.05 possibly is not situated in the localized states, but in delocalized range.

Key words: infrared spectra, Bi-Sb alloys, As doping

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