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2007 , Vol. 22 >Issue 6: 1108 - 1112

DOI: https://doi.org/10.3724/SP.J.1077.2007.01108

研究论文

Pb1-xSrxSe薄膜材料的微结构和光学特性

  • 王擎雷 ,
  • 吴惠桢 ,
  • 斯剑霄 ,
  • 徐天宁 ,
  • 夏明龙 ,
  • 谢正生 ,
  • 劳燕锋
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  • (1. 浙江大学 物理系, 杭州 310027; 2. 中国科学院 上海微系统与信息技术研究所信息功能材料国家重点实验室, 上海 200050)

收稿日期: 2006-11-30

  修回日期: 2007-03-15

  网络出版日期: 2007-11-20

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Microstructure and Optical Properties of Pb1-xSrxSe Thin Films

  • WANG Qing-Lei ,
  • WU Hui-Zhen ,
  • SI Jian-Xiao ,
  • XU Tian-Ning ,
  • XIA Ming-Long ,
  • XIE Zheng-Sheng ,
  • LAO Yan-Feng
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  • (1. Department of Physics, Zhejiang University, Hangzhou 310027, China; 2. State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China)

Received date: 2006-11-30

  Revised date: 2007-03-15

  Online published: 2007-11-20

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摘要

采用分子束外延的方法在BaF2衬底(111)上制备出了高质量的Pb1-xSrxSe (0≤ x≤0.050)薄膜. X射线衍射结果表明, Pb1-xSrxSe 薄膜为立方相NaCl型晶体结构, 没有观察到SrSe相分离现象, 薄膜的取向为平行于衬底(111)晶面. 薄膜晶格常数随Sr含量的增加逐渐增大, Sr含量由Vegard公式得到. 再用理论模拟Pb1-xSrxSe 薄膜透射光谱的方法得到了相应的带隙. 最后通过介电函数模型拟合得到了PbSe和Pb1-xSrxSe 薄膜在光子能量位于基本带隙附近的折射率n和吸收系数α.

关键词： Pb1-xSrxSe 外延薄膜; 透射光谱; 折射率; 吸收系数

本文引用格式

王擎雷 , 吴惠桢 , 斯剑霄 , 徐天宁 , 夏明龙 , 谢正生 , 劳燕锋 . Pb1-xSrxSe薄膜材料的微结构和光学特性[J]. 无机材料学报, 2007 , 22(6) : 1108 -1112 . DOI: 10.3724/SP.J.1077.2007.01108

Abstract

High quality Pb1-xSrxSe (0≤ x≤0.050) thin films were grown on BaF2(111) substrates by using molecular beam epitaxy(MBE). Optical and structural properties of the Pb1-xSrxSe films were studied using transmission spectrum and high resolution X-ray diffraction (HRXRD). HRXRD patterns indicate that Pb1-xSrxSe films has cubic-phase structure, with no SrSe phase separation.
The films orientation is parallel to (111) surface of substrate. The lattice constants of the Pb1-xSrxSe films increase with increasing Sr content. The Sr content can be obtained by using Vegard formula. Sharp absorption edges are observed in the transmission spectrum of Pb1-xSrxSe films. The fundamental band gap of the Pb1-xSrxSe films is attained by simulation. Refractive indexes and absorption coefficients near the fundamental band-gap are obtained by simulation using dielectric function model(DFM).

Key words： Pb1-xSrxSe epitaxial films; transmission spectrum; refractive index; absorption coefficient

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