CaCu3Ti4O12陶瓷深陷阱松弛特性研究

doi:10.3724/SP.J.1077.2012.12012

无机材料学报 ›› 2012, Vol. 27 ›› Issue (11): 1185-1190.DOI: 10.3724/SP.J.1077.2012.12012 CSTR: 32189.14.SP.J.1077.2012.12012

CaCu₃Ti₄O₁₂陶瓷深陷阱松弛特性研究

杨雁¹, 李盛涛², 李晓², 吴高林¹, 王谦¹, 鲍明晖¹

(1. 重庆市电力公司电力科学研究院重庆 401123; 2. 西安交通大学电力设备电气绝缘国家重点实验室, 西安 710049)

收稿日期:2012-01-05 修回日期:2012-03-15 出版日期:2012-11-20 网络出版日期:2012-10-25
基金资助:
国家自然科学基金(50972118)

Investigation on Relaxation Properties of Deep Bulk Trap in CaCu₃Ti₄O₁₂ ceramics

YANG Yan¹, LI Sheng-Tao², LI Xiao², WU Gao-Lin¹, WANG Qian¹, BAO Ming-Hui¹

(1. Chongqing Electric Power Research Institute, Chongqing 401123, China; 2. State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, China)

Received:2012-01-05 Revised:2012-03-15 Published:2012-11-20 Online:2012-10-25
Supported by:
National Natural Science Foundation of China(50972118)

摘要/Abstract

摘要： 研究了固相反应法及共沉淀法制备的CaCu₃Ti₄O₁₂陶瓷深陷阱松弛特性. 测试了CaCu₃Ti₄O₁₂陶瓷在频率为0.1~10⁷ Hz, 温度为–100~100℃的范围内的介电频谱及温谱. 通过对不同温度下介电频谱的分析, 研究了双Schottky势垒结构中深陷阱松弛特性. 研究表明：在交流小信号作用下, 由于Schottky势垒中深陷阱与Fermi能级的上下关系发生变化, 引起深陷阱电子发射和俘获即电子松弛过程, 在介电频谱中表现为松弛峰; 并且由介电谱的分析结果可得深陷阱能级等微观参数. 比较不同试样的深陷阱参数可知：在CaCu₃Ti₄O₁₂陶瓷中, 在导带以下约0.52和0.12 eV的能级处存在由本征缺陷产生的深陷阱. 介电温谱与频谱的分析类似, 二者可以互为补充.

关键词: CaCu₃Ti₄O₁₂陶瓷, 介电频谱, 松弛特性, Schottky势垒

Abstract: The relaxation properties of deep bulk trap in CaCu₃Ti₄O₁₂ ceramics prepared by solid state reaction and coprecipitation method were investigated. Dielectric spectra at frequency from 0.1 Hz to 10⁷ Hz and in the temperature range from –100℃ to 100℃ were measured. With the analysis of dielectric spectra at different temperature, deep bulk trap relaxation in double Schottky barrier was studied. The relative position between deep bulk trap and Fermi level changed in double Schottky barrier under small AC signal, resulted in electron emission and capture of deep bulk trap, namely relaxation, which exhibited as a peak in dielectric frequency spectra. Furthermore deep bulk trap level, can be received based on frequency spectra analysis. Compared with the parameters of different samples, it is found that there exist deep bulk traps caused by interior defect at the levels with 0.52 eV and 0.12 eV lower than conduction band. The analysis of dielectric temperature spectra is similar, which can be complement for dielectric frequence spectra analysis.

Key words: CaCu₃Ti₄O₁₂, dielectric spectra, relaxation properties, schottky barrier

中图分类号:

TM283

杨雁, 李盛涛, 李晓, 吴高林, 王谦, 鲍明晖. CaCu₃Ti₄O₁₂陶瓷深陷阱松弛特性研究[J]. 无机材料学报, 2012, 27(11): 1185-1190.

YANG Yan, LI Sheng-Tao, LI Xiao, WU Gao-Lin, WANG Qian, BAO Ming-Hui. Investigation on Relaxation Properties of Deep Bulk Trap in CaCu₃Ti₄O₁₂ ceramics[J]. Journal of Inorganic Materials, 2012, 27(11): 1185-1190.

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CaCu₃Ti₄O₁₂陶瓷深陷阱松弛特性研究

Investigation on Relaxation Properties of Deep Bulk Trap in CaCu₃Ti₄O₁₂ ceramics

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