Ho3+掺杂Ge-Ga-S-CsI玻璃中红外发光性能研究

doi:10.3724/SP.J.1077.2010.00546

无机材料学报 ›› 2010, Vol. 25 ›› Issue (5): 546-550.DOI: 10.3724/SP.J.1077.2010.00546 CSTR: 32189.14.SP.J.1077.2010.00546

Ho³⁺掺杂Ge-Ga-S-CsI玻璃中红外发光性能研究

朱军¹, 戴世勋^1,2, 彭波², 徐铁峰¹, 王训四¹, 章向华^1,3

1. 宁波大学信息科学与工程学院, 宁波 315211; 2. 中国科学院西安光学精密机械研究所瞬态光学与光子技术国家重点实验室, 西安 710119; 3. 法国雷恩I大学玻璃与陶瓷国家实验室, 法国雷恩 35042

收稿日期:2009-08-26 修回日期:2009-10-23 出版日期:2010-05-20 网络出版日期:2010-05-12

Mid-infrared Emission Properties of Ho³⁺-doped Ge-Ga-S-CsI Glasses

ZHU Jun¹, DAI Shi-Xun^1,2, PENG Bo², XU Tie-Feng¹, WANG Xun-Si¹, ZHANG Xiang-Hua^1,3

1. College of Information Science and Engineering, Ningbo University, Ningbo 315211, China; 2. State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Science, Xi’an 710119, China; 3. Laboratoire de Verres et Ceramiques, Université de Rennes I, Rennes, France 35042

Received:2009-08-26 Revised:2009-10-23 Published:2010-05-20 Online:2010-05-12

摘要/Abstract

摘要：

采用熔融冷却法制备了系列不同Ho³⁺离子掺杂浓度的Ge-Ga-S-CsI玻璃样品，测试了样品的折射率、吸收光谱以及中红外荧光光谱和Ho³⁺离子5I6能级荧光寿命.应用Judd-Ofelt理论计算了Ho³⁺离子在该基质玻璃中强度参数Ω_i（i=2,4,6）、能级跃迁振子强度fcal、自发跃迁几率Arad等光谱参数.计算了Ho³⁺∶⁵I₅→⁵I₆ (3.86μm)和⁵I₆→⁵I₇ (2.81μm)跃迁的多声子驰豫速率.讨论了中红外荧光特性与Ho³⁺离子掺杂浓度之间的关系.结果表明，在900nm 激光泵浦下观察到了2.81和3.86μm两处中红外荧光，分别对应于Ho³⁺∶⁵I₆→⁵I₇ 和⁵I₅→⁵I₆ 跃迁，当Ho³⁺离子掺杂浓度从0.5wt%增加到1.0wt%时，两处中红外荧光强度都随相应增加，计算的Ho³⁺∶⁵I₅→⁵I₆ 和⁵I₆→⁵I₇ 跃迁多声子驰豫速率分别为29s^-1和34s^-1.

关键词: 中红外发光, 硫系玻璃, 钬离子

Abstract:

A serial of chalcogenide glasses based on Ge-Ga-S-CsI system doped with the different Ho³⁺ ions were synthesized by meltquenching technique. The properties of glasses including refractive indexes, absorption spectra, midinfrared emission spectra and lifetimes of 5I6 level of Ho³⁺ions were measured. The Judd Ofelt intensity parameters Ω_i(i=2,4,6), oscillator strength fcal, spontaneous transition probabilities Arad for Ho³⁺ion were calculated by Judd-Ofelt theory. Multiphonon relaxation rates of the Ho³⁺∶⁵I₅→⁵I₆ and ⁵I₆→⁵I₇ in Ge-Ga-S-CsI glasses were evaluated. Effect of Ho³⁺ion concentration on the fluorescence spectra was investigated. The results indicate that the fluorescence under 900 nm excitation with peak wavelength at 2.81μm and 3.86μm are due to

the Ho³⁺∶⁵I₅→⁵I₆ and ⁵I₆→⁵I₇ transition, respectively. The intensity of the mid-infrared fluorescence are enhanced with the Ho³⁺ ion concentration increasing from 0.5wt% to 1.0wt%. Multiphonon relaxation rates are 29s^-1 and 34s^-1 for the Ho³⁺∶⁵I₅→⁵I₆ and ⁵I₆→⁵I₇ transition, respectively.

Key words: mid-infrared luminescence, chalcogenide glass, Ho³⁺-ion

中图分类号:

TQ171

朱军1, 戴世勋1,2, 彭波2, 徐铁峰1, 王训四1, 章向华1,3. Ho³⁺掺杂Ge-Ga-S-CsI玻璃中红外发光性能研究[J]. 无机材料学报, 2010, 25(5): 546-550.

ZHU Jun1, DAI ShiXun1,2, PENG Bo2, XU TieFeng1, WANG XunSi1, ZHANG XiangHua1,3. Mid-infrared Emission Properties of Ho³⁺-doped Ge-Ga-S-CsI Glasses[J]. Journal of Inorganic Materials, 2010, 25(5): 546-550.

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Ho³⁺掺杂Ge-Ga-S-CsI玻璃中红外发光性能研究

Mid-infrared Emission Properties of Ho³⁺-doped Ge-Ga-S-CsI Glasses

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