1 Badway W A, Afifi H A, Elgai E M. J. Electrochem Soc., 1990, 137: 1592.
2 符史流, 林揆训, 刘育洲等. 材料研究学报, 1995, 10(15): 434.
3 Fang Y K, Lee J J. thin Solid Films, 1989, 169: 51.
4 陈俊芳, 刘祖黎. 化学传感器, 1992, 12(3): 46.
5 刘祖黎, 方国家. 功能材料, 1995, 26(suppl.): 414.
6 Chopra K L, et al. Thin Solid Films, 1983, 102: 1.
7 刘祖黎, 陈俊芳. 华中理工大学学报, 1993, 21(6): 166.
8 Nozik A J. Phys. Rev. B, 1972, 6: 453.
9 Bruneax J, et al. Thin Solid Films, 1991, 197: 129.
10 Chitra Agashe, et al. J. Appl. Phys. Lett., 1987, 51(8): 619.
11 Cullity B D. Elements of X-ray diffraction, 2nd ed. California: Addison-Wesley Publishing Company, Inc., 1978. 284. |