无机材料学报

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扫描探针显微镜研究弛豫铁电体电畴生长

刘希1; 周和平1; 张孝文1; 韩立2; 陈皓明2   

  1. 1. 清华大学材料科学与工程系; 先进陶瓷与精细国家重点实验室, 北京 100084; 2. 清华大学应用物理系, 北京 100084
  • 收稿日期:1998-12-07 修回日期:1999-03-08 出版日期:1999-12-20 网络出版日期:1999-12-20

Scanning Probe Microscopy Study of the Domain Growth in Relaxor Ferroelectrics

LIU Xi1; ZHOU He-Ping1; ZHANG Xiao-Wen1; HAN Li2; CHEN Hao-Ming 2   

  1. 1. State Key Laboratory of New Ceramics & Fine Processing Tsinghua University; Beijing 100082; China; 2. Department of Applied Physics; Tsinghua University; Beijing 100084; China
  • Received:1998-12-07 Revised:1999-03-08 Published:1999-12-20 Online:1999-12-20

摘要: 本文研究了典型弛豫铁电陶瓷0.9PMN-0.1PT中的电畴生长过程.用扫描探针显微镜的轻敲模式和抬举模式对驰豫铁电陶瓷的表面形貌和电场力像进行了观察.结果表明,在施加不同针尖电压(0.05、0.5、1V)的情况下,能够诱导材料中纳米尺度极化微区通过沿<111>方向180°反转,从而形成亚微米尺度电畴.

关键词: 扫描探针显微镜, 电畴, 驰豫铁电体

Abstract: The aim of this paper was to study the domain growth of typical relaxor ferroelectric ceramics 0.9Pb(Mg1/3Nb2/3)O3-0.1PbTiO3. The topographic and elecric force images of samples were observed by Scanning Probe Microscopy taping mode and lift mode respectively The results demonstrate that the nano scale polar regions can switch to sub-micro domains under different dc voltages on the tip. Such process is carried out by 180° domain switching of micro dipoles along < 111 > axis in crystal under extra field.

Key words: scanning probe microscoopy, domain, relaxou ferroelectrics

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