关键词: Mn_xCd_1-xIn₂T_e4, 成分偏析, 红外透射光谱, 磁化率

Abstract: Diluted magnetic semiconductor Mn_xCd_1-xIn₂Te₄(x=0.1, 0.22 and 0.4) ingots were grown by the Bridgman method. The structure and composition of different
phases and the compositional distribution along the axis and radius of the Mn_xCd_1-xIn₂Te₄ ingot were analyzed. α+β+β₁
structures are formed at the tip of the Mn_xCd_1-xIn₂Te₄ ingots. Among them, α and β phases are crystallized from the melt while β1
is precipitated from α phase when temperature is below solidus. The content of β phase increases with the growth process, and finally, a pure β phase-region
is formed. At the end of the ingots, an In₂Te₃-type phase with a fcc structure is crystallized. There exist two distinct interfaces between the different neighbouring
phase-regions. The band gap of Mn_xCd_1-xIn₂Te₄ shifts towards the high energy side with the increase of x. At higher temperatures(50～300K) the variation of
magnetic susceptibility χ with T in Mn_xCd_1-xIn₂Te₄ follows the Curie-Weiss (C-W) law. However, a paramagnetic behavior exists at lower temperature (<50K).
The antiferromagnetic exchange of Mn²⁺ increases with the composition, x.

Key words: Mn_xCd_1-xIn₂Te₄, compositional distribution, infrared transmission spectra, mag- netic susceptibility