Preparation of Anti-reflection Coatings with Hollow Silica Nanoparticles by Self-assembly
SUN Zhi-Juan, CHEN Xue-Lian, JIANG Chun-Yue
图3 不同TEOS用量制备的中空二氧化硅纳米粒子的TEM照片及TEOS用量与空腔体积分率关系图 Fig. 3 TEM images of hollow silica nanoparticles with TEOS amount of 6.00 mLa, 5.00 mLb, 4.00 mLc, 3.00 mLd and 2.00 mLe, and the curve of relation between the amount of TEOS and the void fraction f